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Alexandra Delvallée

Observed names: A Delvallée, A. DELVALLÉE, A. Delvallee, A. Delvallée, Alexandra DELVALLÉE, Alexandra Delvallee, Alexandra Delvallèe, Alexandra Delvallée, Delvallee, Alexandra, Delvallée A, Delvallée Alexandra, Delvallée, Alexandra
Observed institutions: Conservatoire National des Arts et Métiers, École Nationale Supérieure de Techniques Avancées, Laboratoire National de Métrologie et d'Essais, École Nationale Supérieure de Techniques Avancées Paris, Laboratoire commun de métrologie, Unité de Chimie et Procédés
ORCID: 0000-0002-8908-0742
Observed ORCID: 0000-0002-8908-0742
OpenAlex ID: A5000381907
Direct comparison of AFM and SEM measurements on the same set of nanoparticles
2015 · A Delvallée, N Feltin, et al. · Measurement Science and Technology · 80
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Deep Learning Based Instance Segmentation of Titanium Dioxide Particles in the Form of Agglomerates in Scanning Electron Microscopy
2021 · Paul Monchot, Loïc Coquelin, et al. · Nanomaterials · 55
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Deep-reactive ion etching of silicon nanowire arrays at cryogenic temperatures
2024 · Jiushuai Xu, Andam Deatama Refino, et al. · Applied Physics Reviews · 54
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Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology
2019 · Loïc Crouzier, Alexandra Delvallée, et al. · Beilstein Journal of Nanotechnology · 48
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Setup of a high-precision profilometer and comparison of tactile and optical measurements of standards
2014 · H Nouira, J-A Salgado, et al. · Measurement Science and Technology · 40
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Size characterization of airborne SiO2 nanoparticles with on-line and off-line measurement techniques: an interlaboratory comparison study
2013 · C. Motzkus, T. Macé, et al. · Journal of Nanoparticle Research · 38
A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point
2019 · Loïc Crouzier, Alexandra Delvallée, et al. · Ultramicroscopy · 30
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Toward an uncertainty budget for measuring nanoparticles by AFM
2015 · A Delvallée, N Feltin, et al. · Metrologia · 29
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Anomalous dissipation mechanism and Hall quantization limit in polycrystalline graphene grown by chemical vapor deposition
2014 · F. Lafont, R. Ribeiro-Palau, et al. · Physical Review B · 28
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Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison
2023 · Tianjia Bu, Huifang Gao, et al. · Nanotechnology · 26
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Methodology to evaluate the uncertainty associated with nanoparticle dimensional measurements by SEM
2019 · L Crouzier, A Delvallée, et al. · Measurement Science and Technology · 26
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Scanning microwave microscopy applied to semiconducting GaAs structures
2018 · Arne Buchter, Johannes Hoffmann, et al. · Review of Scientific Instruments · 22
Comparison of nanoparticle diameter measurements by Atomic Force Microscopy and Scanning Electron Microscopy
2013 · A. Delvallée, N. Feltin, et al. · International Congress of Metrology (CIM) · 19
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Characterization of aerosols and fibers emitted from composite materials combustion
2015 · C. Chivas-Joly, F. Gaie-Levrel, et al. · Journal of Hazardous Materials · 18
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Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM
2021 · Loïc Crouzier, Alexandra Delvallée, et al. · Ultramicroscopy · 14
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Correlative Analysis of the Dimensional Properties of Bipyramidal Titania Nanoparticles by Complementing Electron Microscopy with Other Methods
2021 · Loïc Crouzier, Nicolas Feltin, et al. · Nanomaterials · 12
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Correlation of AFM/SEM/EDS Images to Discriminate Several Nanoparticle Populations Mixed in Cosmetics
2021 · A. Delvallée, M. Oulalite, et al. · Microscopy Today · 11
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Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy
2021 · François Piquemal, José Morán-Meza, et al. · Nanomaterials · 11
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A substitution method for nanoscale capacitance calibration using scanning microwave microscopy
2020 · José A Morán-Meza, Alexandra Delvallée, et al. · Measurement Science and Technology · 10
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Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
2023 · Nicolas Feltin, Loïc Crouzier, et al. · Nanomaterials · 9
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Scanning probe microscopy (SPM)
2019 · Nicolas Feltin, Sebastien Ducourtieux, et al. · Elsevier eBooks · 9
Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy
2021 · Damien Richert, José Morán-Meza, et al. · Nanomaterials · 8
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Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM
2024 · Nicolas Feltin, Alexandra Delvallée, et al. · Nanomaterials · 7
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Characterisation of titanium dioxide (nano)particles in foodstuffs and E171 additives by single particle inductively coupled plasma-tandem mass spectrometry using a highly efficient sample introduction system
2024 · Isabel Bastardo-Fernández, Rachida Chekri, et al. · Food Additives & Contaminants Part A · 5
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A novel approach for 3D morphological characterization of silica nanoparticle population through HAADF-STEM
2021 · Loïc Crouzier, Frédéric Pailloux, et al. · Measurement · 5
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Works count: 76
Citation count: 639
H-index: 14
I10-index: 19
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