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Eugenia Zugasti

Observed names: Zugasti, E., Zugasti, Eugenia
ORCID: 0000-0003-2285-5926
Observed ORCID: 0000-0003-2285-5926
OpenAlex ID: A5001045225
Random subwavelength structures on glass to improve photovoltaic module performance
2022 · Cristina L. Pinto, Iñaki Cornago, et al. · Solar Energy Materials and Solar Cells · 15
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Parametric analysis of random subwavelength structures with anti-reflective properties on glass applied to photovoltaics
2021 · Cristina L. Pinto, Iñaki Cornago, et al. · Solar Energy Materials and Solar Cells · 11
Susceptibility of CPV optical materials to abrasion
2019 · Jaione Bengoechea, María Jesús Rodríguez, et al. · AIP conference proceedings · 3
Haze-Based study of perovskite solar cells under outdoor and indoor illumination
2026 · Eugenia Zugasti, Alicia Buceta, et al. · Solar Energy
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Advancing Photvoltaic Performance Through Digitalisation in Living Laboratories: Insights From the Promise Project
2025 · Bartolo, Brian, Azzopardi, Brian, et al. · Zenodo (CERN European Organization for Nuclear Research)
New Coating Paradigm to Boost Performance and Durability of Solar Receivers
2024 · Jaione Bengoechea, Cristina Leyre Pinto, et al. · SolarPACES Conference Proceedings
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Innovative glass coating for improving the performance and durability of solar applications
2023 · Jaione Bengoechea, Javier García-Barberena, et al. · Advances in Solar Energy: Heliostat Systems Design, Implementation, and Operation
Outdoor Electrical Performance of Photovoltaic Mini‐Modules with Enhanced Broadband Omnidirectional Antireflective Nanostructured Glass
2023 · Cristina Leyre Pinto, Jaione Bengoechea, et al. · Energy Technology
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'JUMP2Excel' Endeavour
2021 · Azzopardi, Brian, Jately, Vibhu, et al. · Zenodo (CERN European Organization for Nuclear Research)
Recent Solar Cell Results Using UMG-Silicon
2016 · Zugasti, E., Armentia, J., et al. · EU PVSEC
Analysis of Solar Cell Series Resistance Components and Comparison with Electroluminescence Images
2012 · Bengoechea, J., Ezquer Mayo, M., et al. · EU PVSEC
Buckling Test: A Useful Tool for a Mechanical Characterization of Silicon Wafers
2008 · Ezquer, M., Zugasti, E., et al. · EU PVSEC
Transfer and Pick and Place Devices Silmulation for Thin Wafers
2008 · Zugasti, E., Gavilanes-Perez, I., et al. · EU PVSEC
Works count: 26
Citation count: 29
H-index: 3
I10-index: 2
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