Author

Dingyi Wang

Institutions: Shenyang Institute of Automation, Chinese Academy of Sciences, University of Chinese Academy of Sciences, State Key Laboratory of Robotics

Observed institutions: Shenyang Institute of Automation, Chinese Academy of Sciences, University of Chinese Academy of Sciences, State Key Laboratory of Robotics

ORCID: 0009-0000-2853-0140

Observed ORCID: 0009-0000-2853-0140

OpenAlex ID: A5001337085

Quantifying the localized electrical interface using a force-controlled scanning ion conductance microscopy

2026 · Hongyu Wang, Huiyao Shi, et al. · Journal of Colloid and Interface Science

A Force-Feedback Assisted Adaptive Current Threshold Adjustment Method for Scanning Ion Conductance Microscopy

2026 · Hongyu Wang, Huiyao Shi, et al. · IEEE International Conference on Nano/Micro Engineered and Molecular Systems

High-Speed Integral Off-Resonance Atomic Force Microscope

2026 · Kaixuan Wang, Jialin Shi, et al. · Nano Letters

Integrated Hinged Dual-Probe AFM With Squeeze-Film Damping Effect for Differential Noise Suppression

2026 · Kaixuan Wang, Dingyi Wang, et al. · IEEE/ASME Transactions on Mechatronics

Design and Fabrication of Accelerometer Based on Atomic Force Microscope Measurement Principle

2025 · Bin Miao, Hongji Guo, et al. · IEEE Sensors Journal

Multiscale Profile Characterization Based on Atomic Force Microscopy

2025 · Kaixuan Wang, Dingyi Wang, et al. · IEEE Transactions on Instrumentation and Measurement

Works count: 6

Citation count:

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