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Y. T. Lui
Institutions:
City University of Hong Kong,
Kwame Nkrumah University of Science and Technology,
University of Greenwich
Observed institutions:
City University of Hong Kong,
Kwame Nkrumah University of Science and Technology,
University of Greenwich
OpenAlex ID:
A5001365511
Investigation Of The Effects Of Reflow Profile Parameters On Lead-free Solder Bump Volumes And Joint Integrity
2011
·
E. H. Amalu
, Y. T. Lui
, et al.
·
AIP conference proceedings
·
8
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Works count:
1
Citation count:
8
H-index:
1
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