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Author

Nuray Urgun

Observed names: N. Urgun, Nuray URGUN
Institution: Karabük University
Observed institution: Karabük University
ORCID: 0000-0001-6574-4287
Observed ORCID: 0000-0001-6574-4287
OpenAlex ID: A5002383250
Effectuality of frequency dependent dielectric characterization of (N:DLC) film deposition between the metal-semiconductor interface
2024 · N. Urgun, S.O. Tan, et al. · Physica B Condensed Matter · 9
Effectuality of the Frequency Levels on the C&G/ω–V Data of the Polymer Interlayered Metal-Semiconductor Structure
2022 · Jaafar Abdulkareem Mustafa ALSMAEL, Nuray URGUN, et al. · Gazi University Journal of Science Part A Engineering and Innovation · 4
Impedance Response and Phase Angle Determination of Metal-Semiconductor Structure with N-Doped Diamond Like Carbon Interlayer
2024 · Nuray Urgun, Aylar Feizollahi Vahid, et al. · Gazi University Journal of Science Part A Engineering and Innovation · 2
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Impedance and Interface States Depending on Frequency Analysis of Al/(ZnFe2O4-PVA)/p-Si Structures
2024 · Jaafar Alsmael, Nuray Urgun, et al. · Düzce Üniversitesi Bilim ve Teknoloji Dergisi · 1
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An Informetric View to the Negative Capacitance Phenomenon at Interlayered Metal-Semiconductor Structures and Distinct Electronic Devices
2023 · Nuray URGUN, Jaafar ALSMAEL, et al. · Gazi University Journal of Science Part A Engineering and Innovation · 1
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Works count: 5
Citation count: 17
H-index: 2
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