Author

Fu‐Chien Chiu

Observed names: F. C. Chiu, F.C. Chiu, Fu-Chien Chiu, Fu-chien Chiu

Institution: Ming Chuan University

Observed institutions: Ming Chuan University, National Tsing Hua University, Winbond (Taiwan)

ORCID: 0000-0002-0751-4181

Observed ORCID: 0000-0002-0751-4181

OpenAlex ID: A5003144196

A Review on Conduction Mechanisms in Dielectric Films

2014 · Fu-Chien Chiu · Advances in Materials Science and Engineering · 1,657

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Electrical conduction mechanisms of metal∕La2O3∕Si structure

2005 · Fu-Chien Chiu, Hong-Wen Chou, et al. · Journal of Applied Physics · 160

Leakage currents in amorphous Ta2O5 thin films

1997 · Fu-Chien Chiu, Jenn-Jyh Wang, et al. · Journal of Applied Physics · 144

Optical and electrical characterizations of cerium oxide thin films

2010 · Fu-Chien Chiu, Chih-Ming Lai · Journal of Physics D Applied Physics · 138

Reliability characteristics and conduction mechanisms in resistive switching memory devices using ZnO thin films

2012 · Fu-Chien Chiu, Peng-Wei Li, et al. · Nanoscale Research Letters · 107

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Interface characterization and carrier transportation in metal/HfO2/silicon structure

2006 · Fu-Chien Chiu · Journal of Applied Physics · 105

Electron conduction mechanism and band diagram of sputter-deposited Al∕ZrO2∕Si structure

2005 · Fu-Chien Chiu, Zhi-Hong Lin, et al. · Journal of Applied Physics · 79

Current conduction mechanisms in Pr2O3/oxynitride laminated gate dielectrics

2009 · Fu-Chien Chiu, Chun-Yen Lee, et al. · Journal of Applied Physics · 73

Conduction mechanism of resistive switching films in MgO memory devices

2012 · Fu-Chien Chiu, Wen-Chieh Shih, et al. · Journal of Applied Physics · 63

Electrical characterization and current transportation in metal∕Dy2O3∕Si structure

2007 · Fu-Chien Chiu · Journal of Applied Physics · 52

Structural properties and electrical characteristics of high-k Dy2O3 gate dielectrics

2010 · Tung-Ming Pan, Wei-Tsung Chang, et al. · Applied Surface Science · 50

Electrical characterization of CeO2∕Si interface properties of metal-oxide-semiconductor field-effect transistors with CeO2 gate dielectric

2008 · Chun-Heng Chen, Ingram Yin-Ku Chang, et al. · Applied Physics Letters · 39

Interface characterization and current conduction in HfO2-gated MOS capacitors

2008 · H.W. Chen, F.C. Chiu, et al. · Applied Surface Science · 35

Conduction Mechanisms in Resistance Switching Memory Devices Using Transparent Boron Doped Zinc Oxide Films

2014 · Fu-Chien Chiu · Materials · 34

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The charge trapping effect of metal-ferroelectric (PbZr0.53Ti0.47O3)-insulator (HfO2)-silicon capacitors

2005 · Pi-chun Juan, Yu-ping Hu, et al. · Journal of Applied Physics · 34

Thin Film Applications in Advanced Electron Devices

2014 · Fu-Chien Chiu, Tung-Ming Pan, et al. · Advances in Materials Science and Engineering · 33

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An SCR-Incorporated BJT Device for Robust ESD Protection With High Latchup Immunity in High-Voltage Technology

2011 · Chih-Yao Huang, Fu-Chien Chiu, et al. · IEEE Transactions on Device and Materials Reliability · 26

Trap Exploration in Amorphous Boron-Doped ZnO Films

2015 · Fu-Chien Chiu, Wen-Ping Chiang · Materials · 25

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Current Conduction Mechanisms in CeO[sub 2] Thin Films

2008 · Fu-Chien Chiu · Electrochemical and Solid-State Letters · 25

Structural and electrical properties of thin Ho2O3 gate dielectrics

2010 · Tung-Ming Pan, Wei-Tsung Chang, et al. · Thin Solid Films · 24

Electrical characterization of tunnel insulator in metal/insulator tunnel transistors fabricated by atomic force microscope

2005 · Fu-Chien Chiu, Shih-Kai Fan, et al. · Applied Physics Letters · 19

Polarity of Bipolar Resistive Switching Characteristics in ZnO Memory Films

2011 · Wen-Yuan Chang, Ching-Shiang Peng, et al. · Journal of The Electrochemical Society · 18

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Interfacial and Electrical Characterization in Metal–Oxide–Semiconductor Field-Effect Transistors with CeO2 Gate Dielectric

2009 · Fu-Chien Chiu, Shuang-Yuan Chen, et al. · Japanese Journal of Applied Physics · 18

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Electrical properties of metal–HfO2–silicon system measured from metal–insulator–semiconductor capacitors and metal–insulator–semiconductor field–effect transistors using HfO2 gate dielectric

2004 · Fu-Chien Chiu, Shun-An Lin, et al. · Microelectronics Reliability · 17

Electrical characterization and carrier transportation in Hf-silicate dielectrics using ALD gate stacks for 90nm node MOSFETs

2008 · H.W. Chen, S.Y. Chen, et al. · Applied Surface Science · 15

Works count: 80

Citation count: 3,201

H-index: 20

I10-index: 33