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Author

Changjun Li

Observed name: C. Li
Observed institution: Air Force Engineering University
ORCID: 0000-0001-7582-6358
Observed ORCID: 0000-0001-7582-6358
OpenAlex ID: A5003604768
Degradation modeling and remaining useful life prediction for electronic device under multiple stress influences
2025 · Changjun Li, Jinjun Cheng, et al. · Scientific Reports · 18
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Reliability analysis and remaining useful life estimation of a two-variable phased degradation system
2025 · Bincheng Wen, Xin Zhao, et al. · Computers in Industry · 5
Study on emergency ventilation optimization method for tritium leakage accident of high-pressure storage vessel
2022 · Xingfu Cai, Changjun Li, et al. · AIP Advances · 3
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Remaining Useful Life Prediction of Electronic Power Components Based on a Hybrid Model Combining Bidirectional Long Short-Term Memory Networks and Gaussian Process Regression
2026 · Xiaoxu Chu, Jinjun Cheng, et al. · Technologies · 2
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Service fatigue life and service calendar life limits of aircraft structure: aircraft structural life envelope
2016 · Y. He, C. Li, et al. · The Aeronautical Journal · 2
Degradation Modeling and RUL Prediction for UAV Bearings Based on a Two-Phase Wiener Process with Stochastic Jumps
2026 · Ziyi Yu, Xin Zhao, et al. · Mathematics · 1
Two-phase system degradation modeling and remaining useful life prediction based on Lévy process
2026 · Ziyi Yu, Xin Zhao, et al. · Applied Mathematical Modelling · 1
A Reliability Analysis Model based on Time Alignment of Multi-source Data
2024 · Bincheng Wen, Changjun Li, et al. · Global Reliability and Prognostics and Health Management Conference (PHM) · 1
Multi-Component Systems Remaining Useful Life Prediction Integrating Physical Prior and Variational Spatiotemporal Networks
2026 · Changjun Li, Jinjun Cheng, et al. · Sensors
Response Analysis of the Darlington Transistor Amplification Mode under Transient Electrical Stress
2026 · Changjun Li, Jinjun Cheng, et al. · International Conference on Generative Artificial Intelligence and Information Security (GAIIS)
Research on Degradation Mechanism of Darlington Transistor Under Electrical and Thermal Stress
2026 · Changjun Li, Jinjun Cheng, et al. · IEEE Access
Feature Parameter Prediction Based on A Hybrid CNN-Bi-LSTM with Attention Mechanism Fusion
2025 · Xiaoxu Chu, Jinjun Cheng, et al. · Global Reliability and Prognostics and Health Management Conference (PHM)
Research on Feature Fusion and Dynamic Degradation Modeling of Power Driver Devices Based on Physics-Informed Neural Network
2025 · Changjun Li, Jinjun Cheng, et al. · SSRN Electronic Journal
Coupling Sensitivity Analysis and Life Prediction of Multi-Degradation Variable Models
2024 · Haizhen Zhu, Bincheng Wen, et al. · Global Reliability and Prognostics and Health Management Conference (PHM)
Modelling and Reliability Analysis of Two-Variable Phased Nonlinear Degradation Systems
2024 · Bincheng Wen, Changjun Li, et al. · International Conference on Artificial Intelligence, Automation and High Performance Computing (AIAHPC)
Works count: 16
Citation count: 33
H-index: 3
I10-index: 1
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