Author

Andrea Baroni

Observed names: A. Baroni, Andrea BARONI, Baroni, Andrea
ORCID: 0000-0002-5205-0398
Observed ORCID: 0000-0002-5205-0398
OpenAlex ID: A5004515696
2022 · Andrea Baroni, Artem Glukhov, et al. · IEEE Transactions on Device and Materials Reliability · 42
2024 · Jianan Wen, Andrea Baroni, et al. · Design, Automation, and Test in Europe · 10
2022 · Artem Glukhov, Valerio Milo, et al. · IEEE International Reliability Physics Symposium proceedings · 10
2025 · D. Maldonado, C. Acal, et al. · Materials Science in Semiconductor Processing · 9
2025 · Andrea Baroni, Eduardo Pérez, et al. · IEEE Transactions on Device and Materials Reliability · 8
2024 · Keerthi Dorai Swamy Reddy, Eduardo Pérez, et al. · The European Physical Journal B · 8
2021 · Andrea Baroni, Cristian Zambelli, et al. · IEEE International Integrated Reliability Workshop final report · 8
2024 · Kristina Nikiruy, Eduardo Perez, et al. · Scientific Reports · 7
2023 · Daniel Reiser, Marc Reichenbach, et al. · IEEE Interregional NEWCAS Conference (NEWCAS) · 6
2023 · Markus Fritscher, Alessandro Veronesi, et al. · Lecture notes in computer science · 6
2025 · Jianan Wen, Fabian Luis Vargas, et al. · Microelectronics Reliability · 5
2024 · Markus Fritscher, Simranjeet Singh, et al. · Scientific Reports · 5
2024 · A. Baroni, E. Pérez, et al. · IEEE International Integrated Reliability Workshop final report · 5
2023 · Tommaso Rizzi, Andrea Baroni, et al. · IEEE Transactions on Device and Materials Reliability · 5
2025 · Jianan Wen, Andrea Baroni, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 4
2025 · Max Uhlmann, Milosz Krysik, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 4
2024 · Daniel Reiser, Junchao Chen, et al. · Design Automation for Embedded Systems · 4
2024 · Jianan Wen, Fabian Luis Vargas, et al. · IEEE Latin American Test Symposium (LATS) · 3
2022 · Artem Glukhov, Nicola Lepri, et al. · IFIP/IEEE International Conference on Very Large Scale Integration · 3
2023 · Tommaso Rizzi, Andrea Baroni, et al. · IEEE International Integrated Reliability Workshop final report · 2
2023 · Ruolan Jia, Stefan Pechmann, et al. · Conference on Ph.D. Research in Microelectronics and Electronics · 2
Works count: 38
Citation count: 217
H-index: 8
I10-index: 7
Year
Topic
Type