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Alfonso Maurelli

Observed name: A. Maurelli
Observed institution: STMicroelectronics (Italy)
ORCID: 0000-0003-3641-8831
Observed ORCID: 0000-0003-3641-8831
OpenAlex ID: A5004651393
Phase change memory for automotive grade embedded NVM applications
2020 · Paolo Cappelletti, Roberto Annunziata, et al. · Journal of Physics D Applied Physics · 113
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High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications
2020 · F. Arnaud, P. Ferreira, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 52
BEOL Process Effects on ePCM Reliability
2022 · A. Redaelli, A. Gandolfo, et al. · IEEE Journal of the Electron Devices Society · 15
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SoC and SiP, the Yin and Yang of the Tao for the New Electronic Era
2009 · Alfonso Maurelli, Didier Belot, et al. · Proceedings of the IEEE · 15
A Test Structure for Contact and Via Failure Analysis in Deep-Submicrometer CMOS Technologies
2006 · A. Cabrini, D. Cantarelli, et al. · IEEE Transactions on Semiconductor Manufacturing · 14
Embedded PCM macro for automotive-grade microcontroller in 28nm FD-SOI
2019 · F. Disegni, R. Annunziata, et al. · Symposium on VLSI Circuits · 13
High performance Flash memory for 65 nm embedded automotive application
2010 · Fausto Piazza, Christian Boccaccio, et al. · IEEE International Memory Workshop (IMW) · 11
Flash memories for SoC: an overview on system constraints and technology issues
2005 · L. Larcher, P. Pavan, et al. · International Workshop on System-on-Chip for Real-Time Applications · 11
Improving Ge-rich GST ePCM reliability through BEOL engineering
2021 · A. Redaelli, A. Gandolfo, et al. · European Solid-State Device Research Conference · 10
Performance and reliability of a 4Mb Si nanocrystal NOR Flash memory with optimized 1T memory cells
2008 · C. Gerardi, G. Molas, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 10
A Triple-well Architecture for Low-voltage Operation in Submicron CMOS Devices
1996 · C. Auricchio, R. Bez, et al. · European Solid-State Device Research Conference · 9
16MB High Density Embedded PCM macrocell for automotive-grade microcontroller in 28nm FD-SOI, featuring extension to 24MB for Over-The-Air software update
2021 · F. Disegni, A. Ventre, et al. · Symposium on VLSI Circuits · 7
ASIL-D automotive-grade microcontroller in 28nm FD-SOI with full-OTA capable 21MB embedded PCM memory and highly scalable power management
2023 · N. Grossier, F. Disegni, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 6
Heater system optimization for robust ePCM reliability and scalability in 28nm FDSOI technology
2021 · R. Ranica, R. Berthelon, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 6
Status and perspectives of embedded Non-Volatile memories
2013 · Alfonso Maurelli · IEEE International Conference on IC Design and Technology (ICICDT) · 3
Defect generation and suppression in device processes using a shallow trench isolation scheme
2003 · D. Peschiaroli, Massimo Brambilla, et al. · BOA (University of Milano-Bicocca) · 3
A Salicided Flash EEPROM for Embedded Memory Applications
1996 · S. Marangon, A. Maurelli, et al. · European Solid-State Device Research Conference · 3
A failure analysis test structure for deep sub-micron CMOS copper interconnect technologies
2005 · A. Cabrini, D. Cantarelli, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 2
Robust and Compact Quaternary Symbol Coding 3Cells/2Bits16MB Embedded PCM Solution in 28nm FD-SOI CMOS with Automotive Grade
2024 · M. Carissimi, A. Tomasoni, et al. · 1
Advanced salicided 4 Mbit flash memory array with borderless contacts
2001 · D. Peschiaroli, C. Clementi, et al. · Microelectronic Engineering · 1
Floating-Gate 1Tr-NOR eFlash Memory
2017 · Antonino Conte, Fabio Disegni, et al. · Integrated circuits and systems
Novel test strategy for statistical evaluation of defect density and reliability of contacts and vias
2005 · A. Cabrini, G. Torelli, et al. · IEEE International Reliability Physics Symposium proceedings
A Flash technology programmable non-volatile switch
2004 · C. Auricchio, M. Borgatti, et al. · IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
A test chip for contact and via failure analysis for 90-nm copper interconnect CMOS technology
2003 · A. Cabrini, P. Cappelletti, et al.
High Density Embedded Flash Memory for 0.35 um Process
1998 · F. Piazza, A. Maurelli, et al. · European Solid-State Device Research Conference
Works count: 27
Citation count: 305
H-index: 10
I10-index: 10
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