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Cui Bo Yu
Observed name:
Cui Yu
Institution:
Hebei Semiconductor Research Institute
Observed institution:
Hebei Semiconductor Research Institute
ORCID:
0000-0002-6346-5943
Observed ORCID:
0000-0002-6346-5943
OpenAlex ID:
A5004727807
Bias-Dependent Trap Characterization in Hydrogen-Terminated Diamond MOSFETs Using Transient Current Analysis
2026
·
Shijie Pan
, Chuangjie Zhou
, et al.
·
IEEE Transactions on Electron Devices
·
2
Deep ultraviolet photodetector based on high-quality cubic-AlN single-crystal films with nitrogen vacancies
2026
·
Lu Yang
, Qingbin Liu
, et al.
·
Applied Physics Letters
A 220-GHz On-Chip Mixer Circuit Using Microstrip Lines and GaAs SBD
2026
·
Xiaolin Hao
, Guodong Gu
, et al.
·
IEEE Microwave and Wireless Technology Letters
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Works count:
3
Citation count:
2
H-index:
1
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