Get started
Author

Md. Akhlak Alam

Observed name: Md. A. Alam
ORCID: 0000-0002-7236-8838
Observed ORCID: 0000-0002-7236-8838
OpenAlex ID: A5004731718
X‐ray standing wave assisted XANES for depth dependent chemical state analysis of Cr in Cr 2 O 3 /Cr bilayer structure
2024 · Ayushi Trivedi, Md. Akhlak Alam, et al. · Surface and Interface Analysis · 7
PDF
Improvement of limit of detection sensitivities in the parts per billion range using conventional geometry synchrotron radiation excited EDXRF measurements
2022 · Md. Akhlak Alam, M. K. Tiwari, et al. · Journal of Analytical Atomic Spectrometry · 7
PDF
Depth profile analysis of 100 keV Ni ions in Si 〈100〉 substrate
2023 · Md. Akhlak Alam, M.K. Tiwari, et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 5
Structural characterization of Au/Cr bilayer thin films using combined X‐ray reflectivity and grazing incidence X‐ray fluorescence measurements
2022 · Md. Akhlak Alam, Manoj K. Tiwari, et al. · Surface and Interface Analysis · 5
Depth profiling of energetic Au ions inside P-type Si 〈1 0 0〉 substrate
2021 · Md. Akhlak Alam, Ayushi Trivedi, et al. · Applied Surface Science · 2
Analysis of TiO 2 and Ti Nanolayers Irradiated With Highly Charged Xe q+ Ions Using Synchrotron Radiation Based GIXRF Method
2025 · R. Stachura, D. Banaś, et al. · X-Ray Spectrometry · 1
Works count: 6
Citation count: 27
H-index: 4
I10-index:
Year
Topic
Type