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R. Rieder

Observed names: Rieder, R., Robert Rieder
OpenAlex ID: A5005011558
Total reflection X-ray fluorescence analysis with monoenergetic excitation and full spectrum excitation using rotating anode X-ray tubes
1993 · Wolfgang Ladisich, Robert Rieder, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 50
Total-reflection X-ray fluorescence analysis using special X-ray sources
1993 · P. Wobrauschek, P. Kregsamer, et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 31
Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures
1995 · R. Rieder, P. Wobrauschek, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 27
Total reflection X-ray fluorescence analysis of light elements using synchrotron radiation
1994 · Christina Streli, P. Wobrauschek, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 27
Total reflection x‐ray fluorescence analysis of light elements under various excitation conditions
1995 · C. Streli, P. Wobrauschek, et al. · X-Ray Spectrometry · 19
Quantitative total reflection X‐ray fluorescence analysis with monoenergetic excitation
1994 · Wolfgang Ladisich, Robert Rieder, et al. · X-Ray Spectrometry · 19
A multifunctional vacuum chamber for total reflection X-ray fluorescence analysis in various excitation and detection geometries for detection limits in the femtogram range
1993 · Robert Rieder, Wolfgang Ladisich, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 12
TXRF with Various Excitation Sources
1991 · Peter Wobrauschek, Peter Kregsamer, et al. · Advances in X-ray Analysis · 11
Ion projection microlithography for submicron device fabrication
1981 · G. Stengl, R. Kaitna, et al. · Journal of Vacuum Science and Technology · 10
Detection of transmutational elements in copper by means of total reflection x‐ray fluorescence spectrometry using synchrotron radiation
1995 · F. Hegedüs, P. Wobrauschek, et al. · X-Ray Spectrometry · 9
Total reflection x‐ray fluorescence spectrometry of metal samples using synchrotron radiation at SSRL
1993 · F. Hegedüs, P. Wobrauschek, et al. · X-Ray Spectrometry · 9
Theoretical Considerations about Total Reflection X-Ray Fluorescence for Light Element Analysis at Various Excitation Energies and Experimental Results
1995 · Christina Streli, Peter Wobrauschek, et al. · Analytical Sciences · 7
TXRF with Various Excitation Sources
1992 · Peter Wobrauschek, Peter Kregsamer, et al. · Springer eBooks · 6
Total Reflection Xrf of Light Elements Using Various Excitation Sources
1993 · Christina Streli, P. Wobrauschek, et al. · Advances in X-ray Analysis · 5
Txrf - Sources - Samples and Detectors
1997 · P. Wobrauschek, P. Kregsamer, et al. · Springer eBooks · 2
Microscopic Images of Surface and Subsurface Parts of Planets Using TV Microscope Mikrotel
1996 · P. Jakeš, Jakub Boček, et al. · Lunar and Planetary Science Conference · 1
An Integrated X-Ray Tube - Polarizer EDXRF-Spectrometer in Cartesian Geometry
1992 · Robert Rieder, Peter Wobrauschek, et al. · Springer eBooks · 1
An Integrated X-Ray Tube - Polarizer EDXRF-Spectrometer in Cartesian Geometry
1991 · Robert Rieder, Peter Wobrauschek, et al. · Advances in X-ray Analysis · 1
Determination of Hydrogen in Surface Layers of Planetary Bodies by Means of Forward Scattering Spectrometry
2001 · O. Prilutskyi, B. N. Korchuganov, et al. · Lunar and Planetary Science Conference
Determination of hydrogen in surface layers of planetary bodies by means of forward spectrometry
2001 · Prilutskyi, O., Korchuganov, B., et al. · Max Planck Institute for Plasma Physics
Investigation of Chemical Composition of Substances Onboard Spacecraft Landing Modules: Alpha-Proton-X-ray Spectrometer
1998 · R. Rieder, H. Waenke, et al. · Cosmic Research
Refinement of Alpha-Proton-X-ray Spectrometry Using the Thermal Analysis Methods
1998 · B. M. Andreichikov, H. Waenke, et al. · Cosmic Research
Total Reflection XRF of Light Elements Using Various Excitation Sources
1994 · Christina Streli, P. Wobrauschek, et al. · Springer eBooks
Works count: 24
Citation count: 247
H-index: 9
I10-index: 9
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