Author

Servaas Vandenberghe

Observed names: S. Vandenberghe, Vandenberghe, S.

Observed institutions: IMEC, KU Leuven

OpenAlex ID: A5005456935

A fast software implementation for arithmetic operations in GF(2n)

1996 · Erik De Win, Antoon Bosselaers, et al. · Lecture notes in computer science · 130

Straightforward and accurate nonlinear device model parameter-estimation method based on vectorial large-signal measurements

2002 · D.M.M.-P. Schreurs, J. Verspecht, et al. · IEEE Transactions on Microwave Theory and Techniques · 80

A fast software implementation for arithmetic operations in GF$(2^n)$

1996 · Antoon Bosselaers, Peter De Gersem, et al. · Lirias · 30

Characterising differences between measurementandcalibration wafer in probe-tip calibrations

1999 · G. Carchon, B. Nauwelaers, et al. · Electronics Letters · 20

Design-oriented measurement-based scaleable models for multilayer MCM-D integrated passives. Implementation in a design libary offering automated layout

2000 · G. Carchon, P. Pieters, et al. · 17

Characteristic impedance extraction using calibration comparison

2001 · S. Vandenberghe, D.M.M.-P. Schreurs, et al. · IEEE Transactions on Microwave Theory and Techniques · 12

Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurements

2003 · D. Schreurs, J. Verspecht, et al. · IEEE MTT-S International Microwave Symposium digest · 11

New analytic expressions for mutual inductance and resistance of coupled interconnects on lossy silicon substrate

2002 · H. Ymeri, B. Nauwelaers, et al. · IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) · 11

ANN Model For SiGe HBTs Constructed From Time-Domain Large-Signal Measurements

2002 · Schreurs, D., Vandenberghe, S., et al. · AMS Acta (University of Bologna) · 11

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Optical Control of a Backside Illuminated Thin-Film Metamorphic HEMT

2002 · Vandersmissen, R., Schreurs, D., et al. · AMS Acta (University of Bologna) · 10

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A time- and frequency-domain characterization of a thin-film metamorphic HEMT under modulated backside illumination

2004 · R. Vandersmissen, D. Schreurs, et al. · International Journal of RF and Microwave Computer-Aided Engineering · 8

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Identifying error-box parameters from the twelve-term vector network analyzer error model

2004 · S. Vandenberghe, D. Schreurs, et al. · 8

Accurate analytic expressions for frequency-dependent inductance and resistance of single on-chip interconnects on conductive silicon substrate

2002 · Hasan Ymeri, Bart Nauwelaers, et al. · Physics Letters A · 7

Capabilities of Vectorial Large-Signal Measurements to Validate RF Large-Signal Device Models

2001 · D. Schreurs, E.P. Vandamme, et al. · ARFTG Microwave Measurement Conference · 7

Compensating Differences Between Measurement and Calibation Wafer in Probe Tip Calibrations - Deembedding of Line Parameters

1998 · G. Carchon, D. Schreurs, et al. · European Microwave Conference (EuMC) · 5

Admittance matrix calculations of on-chip interconnects on lossy silicon substrate using multilayer Green's function

2002 · H. Ymeri, B. Nauwelaers, et al. · IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) · 4

Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETs

2002 · D. Schreurs, E. Vandamme, et al. · IEEE MTT-S International Microwave Symposium digest · 4

Simultaneous Power and Noise Optimization of Active Circulators

1998 · G. Carchon, B. Nauwelaers, et al. · European Microwave Conference (EuMC) · 4

Direct Extraction Of The Non-Linear Hemt Model From Vectorial Large-Signal Measurements

1998 · D. Schreurs, S. Vandenberghe, et al. · 4

Frequency‐dependent expressions for inductance and resistance of microstrip line on silicon substrate

2002 · H. Ymeri, B. Nauwelaers, et al. · Microwave and Optical Technology Letters · 3

Automatically Controlled Coverage of the Voltage Plane of Quasi-Unilateral Devices

2001 · D. Schreurs, S. Vandenberghe, et al. · ARFTG Microwave Measurement Conference · 3

HEMT parameter extraction combining optimization and direct parasitic extraction

2000 · S. Vandenberghe, D. Schreurs, et al. · International Journal of RF and Microwave Computer-Aided Engineering · 3

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Influence of De-Embedding on the Extraction Sensitivity of SiGe HBT

2004 · Hany Taher, Dominique Schreurs, et al. · 2

Advanced non-linear InP HEMT model parameter estimation from vectorial large-signal measurements

2003 · D. Schreurs, J. Verspecht, et al. · Conference proceedings. ... International Conference on Indium Phosphide and Related Materials · 2

Efficient construction of a large-signal behavioural HEMT model from automated vectorial large-signal measurements

2002 · D. Schreurs, S. Vandenberghe, et al. · IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications (EDMO) · 2

Works count: 70

Citation count: 419

H-index: 10

I10-index: 10