2009 · Davide Codegoni, Maria Luisa Polignano, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 14

Extreme Bendability of Atomically Thin MoS2 Grown by Chemical Vapor Deposition Assisted by Perylene-Based Promoter

2022 · Christian Martella, Davide Campi, et al. · Nanomaterials · 13

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A comparative analysis of different measurement techniques to monitor metal and organic contamination in silicon device processing

2015 · M. L. Polignano, D. Codegoni, et al. · physica status solidi (a) · 11

Niobium Contamination in Silicon

2010 · Maria Luisa Polignano, Davide Codegoni, et al. · ECS Transactions · 11

Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology

2023 · L. Laurin, M. Baldo, et al. · IEEE International Reliability Physics Symposium proceedings · 10

Improving Ge-rich GST ePCM reliability through BEOL engineering

2021 · A. Redaelli, A. Gandolfo, et al. · European Solid-State Device Research Conference · 10

Characterization of Organic Contamination in Semiconductor Manufacturing Processes

2009 · A. Nutsch, B. Beckhoff, et al. · AIP conference proceedings · 10

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Investigation of irradiated monolithic transistors for space applications

2003 · D. Codegoni, A. Colder, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 10

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Giant Spin‐Charge Conversion in Ultrathin Films of the MnPtSb Half‐Heusler Compound

2024 · E. Longo, A. Markou, et al. · Advanced Functional Materials · 9

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Non‐Volatile Resistive Switching in Nanoscaled Elemental Tellurium by Vapor Transport Deposition on Gold

2024 · Sara Ghomi, Christian Martella, et al. · Advanced Science · 8

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Review—Characterization of Metal-Contamination Effects in Silicon

2015 · M. L. Polignano, D. Codegoni, et al. · ECS Journal of Solid State Science and Technology · 8

Highly Sensitive Detection of Inorganic Contamination

2009 · Burkhard Beckhoff, Andreas Nutsch, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 8

Nickel Contamination in Silicon: Electrical Activity Study and Microscopy Analysis

2008 · Maria-Luisa Polignano, Davide Codegoni, et al. · ECS Transactions · 7

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Molybdenum Contamination in Indium and Boron Implantation Processes

2007 · Davide Codegoni, Maria Luisa Polignano, et al. · ECS Transactions · 7

Plasma-Assisted Atomic Layer Deposition of IrO2 for Neuroelectronics

2023 · Valerio Di Palma, Andrea Pianalto, et al. · Nanomaterials · 6

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Advanced Metrics for Quantification of By‐Process Segregation beyond Ternary Systems

2023 · Elisa Petroni, Matteo Patelmo, et al. · physica status solidi (RRL) - Rapid Research Letters · 6

Comparability of TXRF Systems at Different Laboratories

2009 · Andreas Nutsch, Burkhard Beckhoff, et al. · ECS Transactions · 6