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Takahiro Shimoi

Observed name: T. Shimoi
Observed institution: Renesas Electronics (Japan)
ORCID: 0009-0006-3314-4432
Observed ORCID: 0009-0006-3314-4432
OpenAlex ID: A5005796904
15.8 A 22nm 10.8Mb Embedded STT-MRAM Macro Achieving over 200MHz Random-Read Access and a 10.4MB/s Write Throughput with an In-Field Programmable 0.3Mb MTJ-OTP for High-End MCUs
2024 · Tomoya Ogawa, Ken Matsubara, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 29
A 22nm 32Mb Embedded STT-MRAM Macro Achieving 5.9ns Random Read Access and 5.8MB/s Write Throughput at up to Tj of 150 °C
2022 · Takahiro Shimoi, Ken Matsubara, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 13
A 22-nm 32-Mb Embedded STT-MRAM Macro Achieving 5.9-ns Random Read Access and 7.4-MB/s Write Throughput at up to 150 °C
2023 · Takahiro Shimoi, Ken Matsubara, et al. · IEEE Journal of Solid-State Circuits · 12
High-Temperature Stable Physical Unclonable Functions with Error-Free Readout Scheme Based on 28nm SG-MONOS Flash Memory for Security Applications
2017 · Tomoya Saito, Hirokazu Nagase, et al. · IEEE International Memory Workshop (IMW) · 11
A 20Mb Embedded STT-MRAM Array Achieving 72% Write Energy Reduction with Self-termination Write Schemes in 16nm FinFET Logic Process
2021 · T. Ito, T. Saito, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 6
A 40nm Embedded SG-MONOS Flash Macro for High-end MCU Achieving 200MHz Random Read Operation and 7.91Mb/mm2 Density with Charge Assisted Offset Cancellation Sense Amplifier
2021 · Masaya Nakano, Yoshinobu Kaneda, et al. · IEEE Asian Solid-State Circuits Conference (A-SSCC) · 3
High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SG-MONOS flash memory for security applications
2017 · Takahiro Shimoi, Tomoya Saito, et al. · IEICE Technical Report; IEICE Tech. Rep. · 1
Trends in Embedded Volatile and Non-Volatile Memories for Scalable Edge AI Applications
2025 · Tomoya Saito, Koichi Nose, et al. · Technical digest - International Electron Devices Meeting/Technical digest
Works count: 8
Citation count: 75
H-index: 5
I10-index: 4
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