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Dorian Johnson
Observed name:
Dorian L Johnson
Institutions:
Microchip Technology (United States),
Microchip Technology (Germany)
Observed institutions:
Microchip Technology (United States),
Microsemi (United States),
Microchip Technology (Germany)
OpenAlex ID:
A5006492685
Single Event Effects Characterization of Microchip’s Programmable Current Limiting Power Switch LX7712
2020
·
Marco Leuenberger
, Mathieu Sureau
, et al.
·
IEEE Radiation Effects Data Workshop (REDW)
·
5
Heavy Ion SEE Testing of Microchip Integrated Motor Controller LX7720
2019
·
Mathieu Sureau
, Russell Stevens
, et al.
·
IEEE Radiation Effects Data Workshop (REDW)
·
5
TID Testing of Microsemi Integrated Motor Controller LX7720 Power Driver with Rotation and Current Sensing
2018
·
Mathieu Sureau
, Russell Stevens
, et al.
·
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
·
5
TID, ELDRS and SEE Hardening and Testing on Mixed Signal Telemetry LX7730 Controller
2017
·
Mathieu Sureau
, Russell Stevens
, et al.
·
IEEE Radiation Effects Data Workshop (REDW)
·
4
Single Event Effects Characterization of Microchip Programmable Current Limiting Power Switch LX7712
2022
·
Marco Leuenberger
, Russell Stevens
, et al.
·
IEEE Radiation Effects Data Workshop (REDW)
·
2
Total Ionizing Dose Characterization of Microchip Programmable Current Limiting Power Switch LX7712
2025
·
Russell Stevens
, Dorian Johnson
·
RADECS Data Workshop
·
1
Total Ionizing Dose Characterization of Microchip Quad RLCL Power Switch LX7714
2023
·
Marco Leuenberger
, Russell Stevens
, et al.
·
RADECS Data Workshop
·
1
High-Energy Atmospheric Neutrons Characterization of Microchip LX4580
2023
·
Marco Leuenberger
, Russell Stevens
, et al.
·
IEEE Radiation Effects Data Workshop (REDW)
·
1
SEE Test Results of Microchip’s Radiation Hardened Retriggerable Latch-up Current Limiter LX7714
2026
·
Jackson Heun
, Etienne Colmet-Daage
, et al.
·
IEEE Radiation Effects Data Workshop (REDW)
Total Non-Ionizing Dose Characterization of Microchip LX7720
2024
·
Russell Stevens
, Dorian L Johnson
·
IEEE Radiation Effects Data Workshop (REDW)
Heavy Ion SEL/SEE Testing of Microsemi Integrated Motor Controller LX7720
2018
·
Mathieu Sureau
, Russell Stevens
, et al.
·
European Conference on Radiation and Its Effects on Components and Systems
Extended TID, ELDRS and SEE Hardening and Testing on Mixed Signal Telemetry LX7730 Controller
2017
·
Mathieu Sureau
, Russell Stevens
, et al.
·
European Conference on Radiation and Its Effects on Components and Systems
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Works count:
12
Citation count:
24
H-index:
4
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