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Rituraj Singh Rathore

New low-power techniques: Leakage Feedback with Stack & Sleep Stack with Keeper
2010 · Pankaj Kr. Pal, Rituraj S. Rathore, et al. · International Conference on Computer and Communication Technology · 26
Influence of plastic waste on the performance of mortar and concrete: A review
2021 · Rituraj Singh Rathore, Harshwardhan Singh Chouhan, et al. · Materials Today Proceedings · 20
Investigation of metal-gate work-function variability in FinFET structures and implications for SRAM cell design
2017 · Rituraj Singh Rathore, Ashwani K. Rana · Superlattices and Microstructures · 19
Impact of line edge roughness on the performance of 14-nm FinFET: Device-circuit Co-design
2017 · Rituraj Singh Rathore, Ashwani K. Rana · Superlattices and Microstructures · 17
Impact of High-k Spacer on Device Performance of Nanoscale Underlap Fully Depleted SOI MOSFET
2017 · Rajneesh Sharma, Rituraj S. Rathore, et al. · Journal of Circuits Systems and Computers · 14
Line edge roughness induced threshold voltage variability in nano-scale FinFETs
2017 · Rituraj Singh Rathore, Rajneesh Sharma, et al. · Superlattices and Microstructures · 14
Threshold voltage variability induced by statistical parameters fluctuations in nanoscale bulk and SOI FinFETs
2017 · Rituraj Singh Rathore, Ashwani K. Rana, et al. · International Conference on Signal Processing, Computing and Control (ISPCC) · 9
Impact of Work Function Fluctuations on Threshold Voltage Variability in a Nanoscale FinFETs
2016 · Rituraj Singh Rathore, Rajneesh Sharma, et al. · IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) · 7
Simulation, fabrication and characterization of Dual-Gate MOSFET test structures
2015 · S. Sinha, R. Rathore, et al. · International Symposium on Physics and Technology of Sensors · 5
Effect of Metal Gate Work Function Variation on Underlap FinFET
2022 · Rituraj S. Rathore, Viranjay M. Srivastava · International Spring Seminar on Electronics Technology · 4
Mechanical and Microstructural Analysis of Cement Mortar Mixes Using PET Plastic Waste
2024 · Rituraj Singh Rathore, Divya Prakash, et al. · IOP Conference Series Earth and Environmental Science · 3
Device- and circuit-level variability due to random discrete dopant in resist- and spacer-defined nanoscale FinFETs
2018 · Rituraj Singh Rathore, Ashwani K. Rana · Journal of Micro/Nanopatterning Materials and Metrology · 3
Nanoscale Static Random-Access-Memory Design Using Strained Underlap Ultra Thin Silicon on Insulator MOSFET for Improved Performance
2017 · Rajneesh Sharma, Rituraj Singh Rathore, et al. · Journal of Nanoelectronics and Optoelectronics · 3
Impact of Oxide Thickness Fluctuation for Resist- and Spacer-Defined FinFETs
2022 · Rituraj S. Rathore, Ashwani K. Rana, et al. · IEEE Latin American Electron Devices Conference (LAEDC) · 2
Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET
2022 · Rituraj S. Rathore, Viranjay M. Srivastava · International Spring Seminar on Electronics Technology · 2
(Digital Presentation) Influence of Fin Width Modulation on Nanoscale FinFET
2022 · Rituraj S. Rathore, Viranjay M. Srivastava · ECS Transactions · 1
Threshold voltage variability induced by spacer- and resist-defined patterning techniques in nanoscale FinFETs
2017 · Rituraj Singh Rathore, Rajneesh Sharma, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 1
Performance Analysis of CNTs as an Application for Future VLSI Interconnects
2012 · Sandeep Sharma, Rajeevan Chandel, et al. · Microelectronics and solid state electronics · 1
Analysis of Source-and-Drain Doping for the Underlapped FinFET
2024 · Rituraj S. Rathore, Viranjay M. Srivastava · IEEE International Conference on Omni-layer Intelligent Systems (COINS)
A design study of embedded system for a hardware assembly of snake and ladder game
2023 · Journal Editor, Pratibodh -, Vikas Sharma, et al. · PRATIBODH
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Effect of Multi-fin with Independent LER on Intrinsic Statistical Variability Sources
2023 · Rituraj S. Rathore, Viranjay M. Srivastava · International Journal of Electrical and Electronic Engineering & Telecommunications
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(Digital Presentation) Influence of Fin Width Modulation on Nanoscale FinFET
2022 · Rituraj S. Rathore, Viranjay M. Srivastava · ECS Meeting Abstracts
A Low-Power Sample-and-Hold Amplifier using 0.05- µm CMOS Technology
2013 · Rituraj Singh Rathore, Vinod Kumar, et al.
Works count: 23
Citation count: 151
H-index: 7
I10-index: 6
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