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Author

Tappei Nishihara

Observed names: T. Nishihara, Tapei Nishihara
Observed institutions: Panasonic (Japan), Meiji University, Japan Society for the Promotion of Science, Ulvac-Phi (Japan), Japan Synchrotron Radiation Research Institute, Meiji (Japan)
ORCID: 0000-0002-2596-5509
Observed ORCID: 0000-0002-2596-5509
OpenAlex ID: A5007262692
Evaluation of correlation between fill factor and high mobility transparent conductive oxide film deposition temperature in the silicon heterojunction solar cells
2021 · Tappei Nishihara, Hiroki Kanai, et al. · Materials Science in Semiconductor Processing · 12
Evaluation of Sn-Doped Indium Oxide Film and Interface Properties on a-Si Formed by Reactive Plasma Deposition
2019 · T. Nishihara, T. Kamioka, et al. · ECS Journal of Solid State Science and Technology · 10
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Identification of Proteins Adsorbed on Hydroxyapatite Ceramics with a Preferred Orientation to a-Plane
2023 · Erika Onuma, Takayuki Honda, et al. · Crystals · 9
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BL46XU: an applied hard X-ray photoelectron spectroscopy beamline HAXPES II at SPring-8
2025 · Satoshi Yasuno, Yasumasa Takagi, et al. · Journal of Synchrotron Radiation · 7
Investigation of the Chemical Reaction between Silver Electrodes and Transparent Conductive Oxide Films for the Improvement of Fill Factor of Silicon Heterojunction Solar Cells
2021 · Tappei Nishihara, Kazuo Muramatsu, et al. · ECS Journal of Solid State Science and Technology · 7
Evaluation of Silicon Nitride Film Formed by Atomic Layer Deposition on the Silicon Substrate with Trench Structure Using Angle-Resolved Hard X-ray Photoelectron Spectroscopy
2020 · Tapei Nishihara, Ryo Yokogawa, et al. · ECS Transactions · 6
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Evaluation of Ag-coated Cu paste as Ag-saving electrode paste for silicon heterojunction solar cells
2025 · Takuya Minowa, Tappei Nishihara, et al. · Japanese Journal of Applied Physics · 5
Development of hard x-ray photoelectron spectroscopy using synchrotron radiation x-ray up to 30 keV
2023 · Satoshi Yasuno, Okkyun Seo, et al. · Review of Scientific Instruments · 5
Oxygen Precipitation Behavior in n-Type Cz-Si Related to Carbon Concentration and Crystal Growth Conditions
2021 · Tappei Nishihara, Kohei Onishi, et al. · Journal of Electronic Materials · 5
Evaluation of the effect of texture size and rounding process on three-dimensional flexibility of c-Si wafer
2024 · Koki Ide, Tappei Nishihara, et al. · Japanese Journal of Applied Physics · 3
Evaluation of Damage in Crystalline Silicon Substrate Induced by Plasma Enhanced Chemical Vapor Deposition of Amorphous Silicon Films
2023 · H. Kojima, T. Nishihara, et al. · ECS Journal of Solid State Science and Technology · 3
Assessing hard X-ray photoelectron spectroscopy as a new evaluation method for studying protein adsorption on anisotropic hydroxyapatite ceramics model
2023 · Erika Onuma, Tappei Nishihara, et al. · Journal of the Ceramic Society of Japan · 2
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Interface Chemistry and the Role of an LiF Interlayer in TiO x /Al Electron-Selective Passivating Contacts for Crystalline Si Solar Cells: Insights from Hard X-ray Photoelectron Spectroscopy
2026 · Shohei Fukaya, Kazuhiro Gotoh, et al. · ACS Applied Materials & Interfaces · 1
(Invited) Evaluation of Chemical and Physical Conformality for SiN x Films Deposited on Trench Substrate By Atomic Layer Deposition
2021 · Atsushi Ogura, Ryo Yokogawa, et al. · ECS Meeting Abstracts · 1
Suppression of Charging Effect by Ambient Pressure Hard X-ray Photoelectron Spectroscopy
2026 · Tappei Nishihara, Seiji Kawasaki, et al. · Photon Science
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Investigation of Binding Energy Scale Calibration Using Deep Core Level of Hard X-ray Photoelectron Spectroscopy with 30 keV X-ray
2025 · Tappei Nishihara, Satoshi Yasuno, et al. · Journal of Physics Conference Series
Evaluation of Process Damage to Crystalline Silicon by Transparent Conductive Oxide Film Deposition
2023 · Haruki Kojima, Tappei Nishihara, et al. · Conference record of the IEEE Photovoltaic Specialists Conference
Evaluation of Silicon Nitride Film Formed by Atomic Layer Deposition on the Silicon Substrate with Trench Structure Using Angle-Resolved Hard X-ray Photoelectron Spectroscopy
2020 · Tapei Nishihara, Ryo Yokogawa, et al. · ECS Meeting Abstracts
High Proton Conductivity in Highly Defected Perovskite-Type Oxide Thin Films
2014 · Y. Zenitani, T. Nishihara, et al. · International Conference on Solid State Devices and Materials (SSDM)
Works count: 19
Citation count: 76
H-index: 6
I10-index: 2
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