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Daniel J. Tschudi
Observed name:
Daniel Tschudi
ORCID:
0000-0002-0680-6529
Observed ORCID:
0000-0002-0680-6529
OpenAlex ID:
A5007424385
Experimental Study of Sealed Tube Accelerated Aging Test Parameters and Determination of the Thermal Class of Transformerboard
2022
·
Aleksandr Levin
, Kevin M. Biggie
, et al.
·
IEEE Transactions on Dielectrics and Electrical Insulation
·
4
Experimental Study of Sealed Tube Accelerated Aging Test Parameters and Determination of the Thermal Class of Transformerboard
2023
·
Aleksandr Levin
, Kevin Biggie
, et al.
·
IEEE Electrical Insulation Conference (EIC)
·
1
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Citation count:
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