Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Yung-Chen Chen
Observed name:
Yung-chen Chen
Institution:
National Cheng Kung University
Observed institutions:
National Yang Ming Chiao Tung University,
National Taiwan University,
Siliconware Precision Industries (Taiwan),
Novatek Microelectronics (Taiwan),
Taiwan Centers for Disease Control,
National Cheng Kung University
show all 6
ORCID:
0009-0009-5373-0430
Observed ORCID:
0009-0009-5373-0430
OpenAlex ID:
A5007604847
The resting sites and blood-meal sources of Anopheles minimus in Taiwan
2008
·
Mei-Chun Chang
, Hwa-Jen Teng
, et al.
·
Malaria Journal
·
40
PDF
Improvement of highly efficient organic light-emitting diodes using Mg-doped ZnO buffer layers
2007
·
Hsin-Hsuan Huang
, Sheng-Yuan Chu
, et al.
·
Thin Solid Films
·
30
PPOM: An Effective Post-Global Placement Optimization Methodology for Better Wirelength and Routability
2022
·
Jai-Ming Lin
, Liang-Chi Zane
, et al.
·
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
·
4
An Effective Analytical Placement Approach to Handle Fence Region Constraint
2024
·
Jai-Ming Lin
, Wei-Yuan Lin
, et al.
·
2
PDF
Test Methodology for Defect-based Bridge Faults
2020
·
Yu-Pang Hu
, Shuo-Wen Chang
, et al.
·
IEEE International Test Conference in Asia (ITC-Asia)
·
2
Study on random telegraph noise of gate-ail-around poly-Si junctionless nanowire transistors
2017
·
Chen-Chen Yang
, Kang-Ping Peng
, et al.
·
Silicon Nanoelectronics Workshop (SNW)
·
1
Test Methodology for Defect-Based Bridge Faults
2022
·
Shuo-Wen Chang
, Yu-Teng Nien
, et al.
·
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Parallel Asynchronous Stochastic Dual Coordinate Descent Algorithms for High Efficiency and Stable Convergence
2021
·
Yung-Chen Chen
, Pangfeng Liu
, et al.
·
Proceedings - Euromicro Workshop on Parallel and Distributed Processing/Proceedings
Fabrication and RTN characteristics of gate-all-around poly-Si junctionless nanowire transistors
2016
·
Chen-Chen Yang
, Yung-Chen Chen
, et al.
·
IEEE Silicon Nanoelectronics Workshop
ECR Plasma-Enhanced Au/Al Bondability in Fine-Pad-Pitch BGA Assembly
2006
·
Mu-chun Wang
, Yung-chen Chen
, et al.
Show more works
View as search
Works count:
10
Citation count:
79
H-index:
3
I10-index:
2
Year
Topic
Type