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Mitsunori Ebara

Observed names: Mitsunori EBARA, 光則 榎原
Observed institution: Kyoto Institute of Technology
ORCID: 0000-0003-1505-0935
Observed ORCID: 0000-0003-1505-0935
OpenAlex ID: A5007689904
Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI
2019 · Mitsunori Ebara, Kodai Yamada, et al. · IEEE Journal of the Electron Devices Society · 49
Evaluation of Soft-Error Tolerance by Neutrons and Heavy Ions on Flip Flops With Guard Gates in a 65-nm Thin BOX FDSOI Process
2020 · Mitsunori Ebara, Kodai Yamada, et al. · IEEE Transactions on Nuclear Science · 21
Intrinsic Vulnerability to Soft Errors and a Mitigation Technique by Layout Optimization on DICE Flip Flops in a 65-nm Bulk Process
2021 · Fuma Mori, Mitsunori Ebara, et al. · IEEE Transactions on Nuclear Science · 18
Radiation-Hardened Structure to Reduce Sensitive Range of a Stacked Structure for FDSOI
2019 · Kodai Yamada, Mitsunori Ebara, et al. · IEEE Transactions on Nuclear Science · 8
Soft-Error Tolerance Depending on Supply Voltage by Heavy Ions on Radiation-Hardened Flip Flops in a 65 nm Bulk Process
2019 · Yuto Tsukita, Mitsunori Ebara, et al. · IEEE International Conference on ASIC (ASICON) · 7
Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process
2019 · Mitsunori Ebara, Kodai Yamada, et al. · IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) · 6
Impact of Combinational Logic Delay for Single Event Upset on Flip Flops in a 65 nm FDSOI Process
2019 · Jun Furuta, Yuto Tsukita, et al. · IEEE International Reliability Physics Symposium proceedings · 4
Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies
2024 · Ryuichi NAKAJIMA, Takafumi ITO, et al. · IEICE Transactions on Electronics · 3
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Soft-error Tolerance by Guard-Gate Structures on Flip-Flops in 22/65 nm FD-SOI Technologies
2022 · Ryuichi Nakajima, Takafumi Ito, et al. · European Conference on Radiation and Its Effects on Components and Systems · 2
Threshold Dependence of Soft-Errors induced by α particles and Heavy Ions on Flip Flops in a 65 nm Thin BOX FDSOI
2018 · Mitsunori Ebara, Kodai Yamada, et al. · IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference · 1
A Radiation-hard Low-delay Flip-Flop with Stacking Structure for SOI Process
2018 · Mitsunori Ebara, Kodai Yamada, et al. · IEICE Technical Report; IEICE Tech. Rep.
65 nm FDSOIプロセスのトランジスタモデルの違いによるフリップフロップのソフトエラー耐性の実測と評価
2018 · 光則 榎原, 晴喜 丸岡, et al.
Evaluation of Soft Error Tolerance on Flip-Flop depending on 65 nm FDSOI Transistor Threshold-Voltage
2018 · Mitsunori Ebara, Haruki Maruoka, et al. · IEICE Technical Report; IEICE Tech. Rep.
Evaluation of a Radiation-Hardened Method and Soft Error Resilience on Stacked Transistors in 28/65 nm FDSOI Processes
2018 · Haruki Maruoka, Kodai Yamada, et al. · IEICE Technical Report; IEICE Tech. Rep.
Works count: 14
Citation count: 119
H-index: 6
I10-index: 3
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