Author

Matthew C. Laderer

Observed names: M. C. Laderer, M.C. Laderer, Matt C. Laderer, Matthew C Laderer, Matthew Laderer
OpenAlex ID: A5007709729
2010 · Michael B. Frish, Richard T. Wainner, et al. · IEEE Sensors Journal · 68
2015 · Clinton J. Smith, Raji Shankar, et al. · Optics Express · 47
2005 · M. B. Frish, R. T. Wainner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 29
2007 · M. B. Frish, M. C. Laderer, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 23
2013 · Michael B. Frish, Richard T. Wainner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 21
2017 · Richard T. Wainner, Nicholas F. Aubut, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 20
2004 · M. B. Frish, R. T. Wainner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2011 · M. B. Frish, R. T. Wainner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12
2013 · Michael B. Frish, Raji Shankar, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2005 · Michael B. Frish, B. David Green, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 5
2007 · Richard T. Wainner, Michael B. Frish, et al. · Conference on Lasers and Electro-Optics · 4
2006 · Richard T Wainner, Mickey B Frish, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 4
2010 · M. B. Frish, J. R. Morency, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2006 · M.B. Frish, R.T Wainner, et al. · Conference on Lasers and Electro-Optics · 1
2006 · Mickey B. Frish, Richard T. Wainner, et al. · Conference on Lasers and Electro-Optics · 1
2018 · Richard T. Wainner, Nicholas F. Aubut, et al. · Imaging and Applied Optics
2013 · Michael B. Frish, Richard T. Wainner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 20
Citation count: 270
H-index: 9
I10-index: 9
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