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Damien Richert

Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy
2021 · François Piquemal, José Morán-Meza, et al. · Nanomaterials · 11
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Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
2024 · Johannes Hoffmann, Sophie de Préville, et al. · IEEE Transactions on Instrumentation and Measurement · 10
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Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy
2021 · Damien Richert, José Morán-Meza, et al. · Nanomaterials · 8
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Eco‐Friendly Deposition of Catalyst‐Free Graphene on Diverse Substrates
2025 · Ahmed Kotbi, Michael Lejeune, et al. · Advanced Sustainable Systems · 6
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A numerical analysis of the short open load calibration robustness for capacitance measurements in scanning microwave microscopy
2024 · Damien Richert, Damien Deleruyelle, et al. · Measurement Science and Technology · 1
Eco‐Friendly Deposition of Catalyst‐Free Graphene on Diverse Substrates (Adv. Sustainable Syst. 4/2025)
2025 · Ahmed Kotbi, Michael Lejeune, et al. · Advanced Sustainable Systems
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Metrology of scanning microwave microscopy applied to transport measurement for semiconductors
2024 · Damien Richert · theses.fr (ABES)
High Resolution Microscopy of Antimonide Heterostructures and Strepsiptera Eyes
2018 · Richert, Damien · SHAREOK (University of Oklahoma; Oklahoma State University; Central Oklahoma University)
Works count: 8
Citation count: 36
H-index: 4
I10-index: 2
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