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Akira Notake
Observed name:
A. Notake
Institution:
Tokyo Electron (Japan)
Observed institutions:
Tokyo Electron (Japan),
Shizuoka University
ORCID:
0000-0001-5761-882X
Observed ORCID:
0000-0001-5761-882X
OpenAlex ID:
A5007955799
Metabolism of bisphenol A by hyper lignin-degrading fungus Phanerochaete sordida YK-624 under non-ligninolytic condition
2014
·
Jianqiao Wang
, Yuto Yamada
, et al.
·
Chemosphere
·
30
PDF
Vacancy-type defects in TiN/ZrO2/TiN capacitors probed by monoenergetic positron beams
2022
·
Akira Uedono
, Naomichi Takahashi
, et al.
·
Thin Solid Films
·
9
PDF
Finite temperature effects on the structural stability of Si-doped HfO2 using first-principles calculations
2023
·
Y. Harashima
, H. Koga
, et al.
·
Applied Physics Letters
·
6
PDF
Vacancy-Type Defects in Thin HfO2 Layers Probed by Monoenergetic Positron Beams
2024
·
Akira Uedono
, Kazuya Kawakami
, et al.
·
IEEE International Symposium on Semiconductor Manufacturing conference proceedings
·
1
Systematic Search for Stabilizing Dopants in ZrO₂ and HfO₂ Using First-Principles Calculations
2023
·
Yosuke Harashima
, Hiroaki Koga
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
1
Systematic Search for Stabilizing Dopants in ZrO2 and HfO2 Using First-Principles Calculations
2022
·
Yosuke Harashima
, Hiroaki Koga
, et al.
·
IEEE International Symposium on Semiconductor Manufacturing conference proceedings
·
1
Vacancy-Type Defects in HfO2 Layers and Their Role in Amorphous-to-Crystalline Transition Studied by Monoenergetic Positron Beams
2025
·
Akira Uedono
, Kazuya Kawakami
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
Impact of Cation Vacancies on Leakage Current on TiN/ZrO2/TiN Capacitors Studied by Positron Annihilation
2022
·
Akira Uedono
, Naomichi Takahashi
, et al.
·
IEEE International Symposium on Semiconductor Manufacturing conference proceedings
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Works count:
8
Citation count:
48
H-index:
3
I10-index:
1
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