Author

Jonathan Nylk

Observed names: J. Nylk, Nylk, Jonathan
Institution: The Open University
ORCID: 0000-0002-2977-4929
Observed ORCID: 0000-0002-2977-4929
OpenAlex ID: A5008757065
2014 · Tom Vettenburg, Heather I C Dalgarno, et al. · Nature Methods · 902
2018 · Jonathan Nylk, Kaley McCluskey, et al. · Science Advances · 103
2014 · Zhengyi Yang, Martynas Prokopas, et al. · Biomedical Optics Express · 96
2015 · Martin Plöschner, Věra Kollárová, et al. · Scientific Reports · 64
2016 · Jonathan Nylk, Kaley McCluskey, et al. · Biomedical Optics Express · 54
2018 · Adriá Escobet-Montalbán, Federico M. Gasparoli, et al. · Optics Letters · 51
2016 · James M. Pullman, Jonathan Nylk, et al. · Biomedical Optics Express · 35
2012 · H. I. C. Dalgarno, T. Čižmár, et al. · Applied Physics Letters · 35
2020 · Matthew J. Broadhead, Calum Bonthron, et al. · Scientific Reports · 33
2019 · Zhengyi Yang, Katy L. H. Cole, et al. · Nature Communications · 33
2020 · Stella Corsetti, Philip Wijesinghe, et al. · OSA Continuum · 21
2013 · S. Anand, J. Nylk, et al. · Optics Express · 18
2020 · Madhu Veettikazhy, Jonathan Nylk, et al. · Scientific Reports · 10
2017 · Ivan Gusachenko, Jonathan Nylk, et al. · Biomedical Optics Express · 7
2020 · Ziv Shemesh, Gal Chaimovich, et al. · Journal of Biophotonics · 4
2019 · Jonathan Nylk, Kishan Dholakia · Elsevier eBooks · 3
2015 · Jonathan Nylk, Zhengyi Yang, et al. · Microscopy and Microanalysis · 3
2026 · Ashutosh Pathak, Andrew James, et al. · Open Research Online (The Open University) · 2
2014 · J. Nylk, C. Mitchell, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2011 · S. Anand, J. Nylk, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2026 · Pathak, Ashutosh Kumar, Parker, Mark A. J., et al. · arXiv (Cornell University) · 1
2021 · Matthew J. Broadhead, Calum Bonthron, et al. · Scientific Reports · 1
2017 · Jonathan Nylk, Kaley McCluskey, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
2017 · Jonathan Nylk, James M. Pullman, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Works count: 51
Citation count: 1,495
H-index: 12
I10-index: 13
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