Author

Dennis G. Manzer

Observed names: D. G. Manzer, D. Manzer, D.G. Manzer, Dennis Manzer

Institution: King Abdulaziz City for Science and Technology

Observed institutions: King Abdulaziz City for Science and Technology, IBM (United States), Cornell University, IBM Research - Thomas J. Watson Research Center

OpenAlex ID: A5008758378

Fabrication and characterization of robust through-silicon vias for silicon-carrier applications

2008 · P. S. Andry, C. K. Tsang, et al. · IBM Journal of Research and Development · 116

Variable reluctance motor characterization

1989 · D.G. Manzer, M. Varghese, et al. · IEEE Transactions on Industrial Electronics · 49

CMOS-Compatible Through Silicon Vias for 3D Process Integration

2006 · Cornelia K. Tsang, Paul S. Andry, et al. · MRS Proceedings · 27

System-on-Package (SOP) Technology, Characterization and Applications

2006 · J.U. Knickerbocker, P.S. Andry, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 23

The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA)

2003 · W. Huott, M. McManus, et al. · IEEE International Test Conference (ITC) · 23

Stabilization of uncertain systems

1981 · Robert Thomas, James Thorp, et al. · IEEE Conference on Decision and Control (CDC) · 18

Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence

2002 · S. Polonsky, D. Knebel, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 10

High-speed control of variable reluctance motors with reduced torque ripple

2003 · L.-C.R. Zai, D.G. Manzer, et al. · Conference proceedings/Conference proceedings - IEEE Applied Power Electronics Conference and Exposition · 8

Multi receiver concentrator photovoltaic testing at extreme concentrations

2010 · Theodore van Kessel, Ayman Abduljabar, et al. · Conference record of the IEEE Photovoltaic Specialists Conference · 6

Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache

1999 · Moyra McManus, Pia Sanda, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 6

High-speed electrical testing of multichip ceramic modules

2005 · D. G. Manzer, J. P. Karidis, et al. · IBM Journal of Research and Development · 5

Control of a hummingbird minipositioner with a multi-transputer MARC controller

2003 · L.C. Zai, L.F. Durfee, et al. · Proceedings - IEEE International Conference on Robotics and Automation/Proceedings · 3

Timing high-speed microprocessor circuits using picosecond imaging circuit analysis

2001 · Steven E. Steen, Moyra K. McManus, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

Attack of the “Holey Shmoos”

2000 · William Huott, Moyra McManus, et al. · EDFA Technical Articles

High Quality Halftone Image Printing Using Resistive Ribbon Thermal Transfer Printing

1989 · D. G. Manzer, R. Lane, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Works count: 15

Citation count: 296

H-index: 8

I10-index: 7