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Author

Paul Jungmann

Observed name: Jungmann, Paul
ORCID: 0000-0003-2997-1540
Observed ORCID: 0000-0003-2997-1540
OpenAlex ID: A5009014011
TCAD-Enabled Machine Learning—An Efficient Framework to Build Highly Accurate and Reliable Models for Semiconductor Technology Development and Fabrication
2023 · Paul Jungmann, Jeffrey B. Johnson, et al. · IEEE Transactions on Semiconductor Manufacturing · 19
Analytical Uncertainty Propagation in Neural Networks
2024 · Paul Jungmann, Julia Poray, et al. · IEEE Transactions on Neural Networks and Learning Systems · 14
Design-aware virtual metrology and process recipe recommendation
2023 · Nathan G. Greeneltch, Haizhou Yin, et al. · DTCO and Computational Patterning · 7
Ring Oscillator DTCO using Machine Learning approach based on TCAD
2024 · Tom Herrmann, Paul Jungmann, et al. · 1
A Reproducible Approach to Virtual Metrology
2025 · Jimmy Pöhlmann, Anna Lopatkina, et al. · IEEE ... International Conference on Data Mining workshops
Technology CAD and Machine Learning: A New Paradigm for Semiconductor Technology Development
2025 · Jeffrey B. Johnson, Eduardo Silva, et al. · IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
Updating Machine Learning Models in Real-World Applications: Finding Best Deployment Settings
2025 · Julia Poray, Paul Jungmann, et al. · International Conference on Artificial Intelligence, Computer, Data Sciences and Applications (ACDSA)
Works count: 8
Citation count: 41
H-index: 3
I10-index: 2
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