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Johan Ericsson
Institution:
Keysight Technologies (United States)
Observed institutions:
Agilent Technologies (United States),
Keysight Technologies (Singapore),
Keysight Technologies (United States),
Keysight Technologies (Austria),
Keysight Technologies (United Kingdom)
ORCID:
0009-0001-7481-3966
Observed ORCID:
0009-0001-7481-3966
OpenAlex ID:
A5009873816
A novel method for measuring phase and group delay of mixers without a reference mixer
2010
·
Joel Dunsmore
, Johan Ericsson
·
ARFTG Microwave Measurement Conference
·
7
Practical Implementation of the 3d Tetrahedral Tlm Method and Visualization of Room Acoustics
2004
·
Stanley J. Miklavcic
, Johan Ericsson
·
7
Pulsed Sub-THz Wideband Vector Component Analysis
2023
·
Jean-Pierre Teyssier
, Joel Dunsmore
, et al.
·
ARFTG Microwave Measurement Conference
·
3
From S-Parameters to Wideband Modulation Stimulus-Response for Sub-THz Component Testing
2025
·
JP Teyssier
, Joel Dunsmore
, et al.
·
IEEE Microwave Magazine
·
2
Wideband active load-pull using hybrid source for RF to Sub THz applications
2026
·
Vincent Gillet
, Johan Ericsson
, et al.
·
ARFTG Microwave Measurement Conference
Sub-THz PA EVM Measurements with Ultra-Wideband Test Signals
2025
·
Jean-Pierre Teyssier
, Vincent Gillet
, et al.
·
European Microwave Conference (EuMC)
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Works count:
6
Citation count:
19
H-index:
3
I10-index:
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