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Rasmus Havelund

Observed names: Havelund, R., Havelund, Rasmus, R. Havelund
Institution: Vejle Sygehus
ORCID: 0000-0001-7316-9761
Observed ORCID: 0000-0001-7316-9761
OpenAlex ID: A5009899566
The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power
2017 · Melissa K Passarelli, Alexander Pirkl, et al. · Nature Methods · 482
Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
2012 · Alexander G. Shard, Rasmus Havelund, et al. · Analytical Chemistry · 149
Functional Electrospun Polystyrene Nanofibers Incorporating α-, β-, and γ-Cyclodextrins: Comparison of Molecular Filter Performance
2010 · Tamer Uyar, Rasmus Havelund, et al. · ACS Nano · 146
Molecular filters based on cyclodextrin functionalized electrospun fibers
2009 · Tamer Uyar, Rasmus Havelund, et al. · Journal of Membrane Science · 125
Thermo-Responsive Core−Sheath Electrospun Nanofibers from Poly (N-isopropylacrylamide)/Polycaprolactone Blends
2010 · Menglin Chen, Mingdong Dong, et al. · Chemistry of Materials · 123
Argon Cluster Ion Source Evaluation on Lipid Standards and Rat Brain Tissue Samples
2013 · Claudia Bich, Rasmus Havelund, et al. · Analytical Chemistry · 95
The matrix effect in organic secondary ion mass spectrometry
2014 · Alexander G. Shard, Steve J. Spencer, et al. · International Journal of Mass Spectrometry · 91
Cyclodextrin functionalized poly(methyl methacrylate) (PMMA) electrospun nanofibers for organic vapors waste treatment
2010 · Tamer Uyar, Rasmus Havelund, et al. · Journal of Membrane Science · 87
3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling
2015 · James Bailey, Rasmus Havelund, et al. · ACS Applied Materials & Interfaces · 78
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Direct electrospinning of Ag/polyvinylpyrrolidone nanocables
2011 · Jie Song, Menglin Chen, et al. · Nanoscale · 76
Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources
2016 · Yuta Yokoyama, Satoka Aoyagi, et al. · Analytical Chemistry · 68
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
2015 · Alexander G. Shard, Rasmus Havelund, et al. · The Journal of Physical Chemistry B · 68
The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning
2009 · Tamer Uyar, Rasmus Havelund, et al. · Nanotechnology · 55
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Intracellular Drug Uptake—A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS
2017 · Carla F. Newman, Rasmus Havelund, et al. · Analytical Chemistry · 40
Direct identification of interfacial degradation in blue OLEDs using nanoscale chemical depth profiling
2023 · Gustavo F. Trindade, Soohwan Sul, et al. · Nature Communications · 39
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Universal Equation for Argon Cluster Size-Dependence of Secondary Ion Spectra in SIMS of Organic Materials
2014 · Martin P. Seah, Rasmus Havelund, et al. · The Journal of Physical Chemistry C · 38
Correlative Hyperspectral Imaging Using a Dimensionality-Reduction-Based Image Fusion Method
2020 · Alan M. Race, Alasdair Rae, et al. · Analytical Chemistry · 28
Improving Secondary Ion Mass Spectrometry C60n+ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing
2013 · R. Havelund, A. Licciardello, et al. · Analytical Chemistry · 26
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size
2015 · M. P. Seah, S. J. Spencer, et al. · The Analyst · 23
Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions
2015 · M. P. Seah, R. Havelund, et al. · The Journal of Physical Chemistry B · 22
SIMS of Delta Layers in Organic Materials: Amount of Substance, Secondary Ion Species, Matrix Effects, and Anomalous Structures in Argon Gas Cluster Depth Profiles
2016 · M. P. Seah, R. Havelund, et al. · The Journal of Physical Chemistry C · 20
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Sampling Depths, Depth Shifts, and Depth Resolutions for Bin+ Ion Analysis in Argon Gas Cluster Depth Profiles
2016 · R. Havelund, M. P. Seah, et al. · The Journal of Physical Chemistry B · 19
Electron Flood Gun Damage Effects in 3D Secondary Ion Mass Spectrometry Imaging of Organics
2014 · Rasmus Havelund, Martin P. Seah, et al. · Journal of the American Society for Mass Spectrometry · 18
Orbitrap noise structure and method for noise unbiased multivariate analysis
2025 · Michael R. Keenan, Gustavo F. Trindade, et al. · Nature Communications · 16
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OrbiSIMS metrology Part I: Optimisation of the target potential and collision cell pressure
2021 · Lidija Matjacic, Martin P. Seah, et al. · Surface and Interface Analysis · 16
Works count: 58
Citation count: 2,142
H-index: 20
I10-index: 37
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