Get started
Author

M. Buzzo

Observed names: Buzzo, Marco, Marco Buzzo
OpenAlex ID: A5010104177
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast
2005 · M. Buzzo, M. Ciappa, et al. · Microelectronics Reliability · 21
Imaging and Dopant Profiling of Silicon Carbide Devices by Secondary Electron Dopant Contrast
2006 · M. Buzzo, M. Ciappa, et al. · IEEE Transactions on Device and Materials Reliability · 19
Two-dimensional dopant imaging of silicon carbide devices by secondary electron potential contrast
2006 · M. Buzzo, M. Ciappa, et al. · Microelectronic Engineering · 16
Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction
2002 · M. Stangoni, M. Ciappa, et al. · Microelectronics Reliability · 11
Hydrogen-Related Donor Formation: Fabrication Techniques, Characterization, and Application to High-voltage Superjunction Transistors
2006 · Hans-Joachim Schulze, Marco Buzzo, et al. · ECS Transactions · 5
Characterization of photonic devices by secondary electron potential contrast
2006 · M. Buzzo, M. Ciappa, et al. · Microelectronics Reliability · 4
Characterization of 2D dopant profiles for the design of proton implanted high-voltage superjunction
2005 · M. Buzzo, M. Ciappa, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 4
Dopant Imaging and Profiling of Wide-Band-Gap Devices by Secondary Electron Potential Contrast
2006 · M. Buzzo, M. Ciappa, et al. · IEEE International Reliability Physics Symposium proceedings · 3
2D junction delineation for the failure analysis of silicon carbide devices
2005 · M. Buzzo, M. Ciappa, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 3
Dopant imaging and profiling of wide bandgap semiconductor devices
2007 · Buzzo, Marco · ETH Zürich Research Collection · 2
Secondary Electron Potential Contrast for Dopant Profiling of Silicon Carbide Devices
2006 · Marco Buzzo, Mauro Ciappa, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2
Advances in Two-Dimensional Dopant Profiling and Imaging of 4H-SiC Devices
2006 · Marco Buzzo, Mauro Ciappa, et al. · Materials science forum · 2
Advances in Two-Dimensional Dopant Profiling and Imaging of 4H-SiC Devices
2006 · Marco Buzzo, Mauro Ciappa, et al. · Materials science forum · 2
Characterization of Unconventional Engineering Solutions for Superjunction Devices
2006 · M. Buzzo, M. Ciappa, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 1
Secondary Electron Potential Contrast in Wide-Bandgap Semiconductors: More Than Just Dopant Profiling with the SEM
2007 · Marco Buzzo, Mauro Ciappa, et al. · EDFA Technical Articles
Hydrogen-Related Donor Formation: Fabrication Techniques, Characterization, and Application to High-Voltage Superjunction Transistors
2006 · Hans-Joachim Schulze, Marco Buzzo, et al. · ECS Meeting Abstracts
PDF
Works count: 16
Citation count: 95
H-index: 5
I10-index: 4
Year
Topic
Type