Author

Mark Doczy

Observed name: M. Doczy
Observed institution: Intel (United States)
OpenAlex ID: A5011490923
2005 · R. Chau, S. Datta, et al. · IEEE Transactions on Nanotechnology · 666
2004 · R. Chau, S. Datta, et al. · IEEE Electron Device Letters · 511
2003 · B.S. Doyle, S. Datta, et al. · IEEE Electron Device Letters · 463
2004 · B. Doyle, B. Boyanov, et al. · Symposium on VLSI Technology · 225
2006 · J. Kavalieros, B. Doyle, et al. · Symposium on VLSI Technology · 224
2006 · S. Datta, T. Ashley, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 132
2002 · R. Chau, J. Kavalieros, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 98
2004 · S. Datta, G. Dewey, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 83
2002 · Robert Chau, Brian Doyle, et al. · International Conference on Solid State Devices and Materials (SSDM) · 77
2003 · R. Chau, S. Datta, et al. · International Workshop on Gate Insulator (IWGI) · 66
2004 · R. Chau, B. Doyle, et al. · Conference digest · 54
2003 · Robert Chau, Boyan Boyanov, et al. · Physica E Low-dimensional Systems and Nanostructures · 48
2002 · D. Barlage, R. Arghavani, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 47
2004 · R. Chau, M. Doczy, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 18
2005 · R. Chau, J. Brask, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 16
2011 · D. A. Ferrer, S. Guchhait, et al. · Journal of Applied Physics · 14
2004 · S. Datta, J. Brask, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 13
Works count: 29
Citation count: 3,143
H-index: 17
I10-index: 20
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