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Mark Doczy
Observed name:
M. Doczy
Observed institution:
Intel (United States)
OpenAlex ID:
A5011490923
Benchmarking Nanotechnology for High-Performance and Low-Power Logic Transistor Applications
2005
·
R. Chau
, S. Datta
, et al.
·
IEEE Transactions on Nanotechnology
·
666
High- $kappa$ /Metal–Gate Stack and Its MOSFET Characteristics
2004
·
R. Chau
, S. Datta
, et al.
·
IEEE Electron Device Letters
·
511
High performance fully-depleted tri-gate CMOS transistors
2003
·
B.S. Doyle
, S. Datta
, et al.
·
IEEE Electron Device Letters
·
463
Tri-Gate fully-depleted CMOS transistors: fabrication, design and layout
2004
·
B. Doyle
, B. Boyanov
, et al.
·
Symposium on VLSI Technology
·
225
Tri-Gate Transistor Architecture with High-k Gate Dielectrics, Metal Gates and Strain Engineering
2006
·
J. Kavalieros
, B. Doyle
, et al.
·
Symposium on VLSI Technology
·
224
Application of high-κ gate dielectrics and metal gate electrodes to enable silicon and non-silicon logic nanotechnology
2005
·
Robert Chau
, Justin Brask
, et al.
·
Microelectronic Engineering
·
150
85nm gate length enhancement and depletion mode InSb quantum well transistors for ultra high speed and very low power digital logic applications
2006
·
S. Datta
, T. Ashley
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
132
CMOS-Compatible Synthesis of Large-Area, High-Mobility Graphene by Chemical Vapor Deposition of Acetylene on Cobalt Thin Films
2011
·
Michael E. Ramón
, Aparna Gupta
, et al.
·
ACS Nano
·
128
Experimental demonstration of the coexistence of spin Hall and Rashba effects in β−tantalum/ferromagnet bilayers
2015
·
Gary Allen
, Sasikanth Manipatruni
, et al.
·
Physical Review B
·
108
PDF
A 50 nm depleted-substrate CMOS transistor (DST)
2002
·
R. Chau
, J. Kavalieros
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
98
High mobility Si/SiGe strained channel MOS transistors with HfO/sub 2//TiN gate stack
2004
·
S. Datta
, G. Dewey
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
83
Advanced Depleted-Substrate Transistors: Single-gate, Double-gate and Tri-gate
2002
·
Robert Chau
, Brian Doyle
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
·
77
Gate dielectric scaling for high-performance CMOS: from SiO2 to high-K
2003
·
R. Chau
, S. Datta
, et al.
·
International Workshop on Gate Insulator (IWGI)
·
66
Silicon nano-transistors and breaking the 10 nm physical gate length barrier
2004
·
R. Chau
, B. Doyle
, et al.
·
Conference digest
·
54
Silicon nano-transistors for logic applications
2003
·
Robert Chau
, Boyan Boyanov
, et al.
·
Physica E Low-dimensional Systems and Nanostructures
·
48
High-frequency response of 100 nm integrated CMOS transistors with high-K gate dielectrics
2002
·
D. Barlage
, R. Arghavani
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
47
Advanced CMOS transistors in the nanotechnology era for high-performance, low-power logic applications
2004
·
R. Chau
, M. Doczy
, et al.
·
IEEE International Conference on Solid-State and Integrated Circuit Technology
·
18
Emerging silicon and non-silicon nanoelectronic devices: opportunities and challenges for future high-performance and low-power computational applications (invited paper)
2005
·
R. Chau
, J. Brask
, et al.
·
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
·
16
Origin of shape anisotropy effects in solution-phase synthesized FePt nanomagnets
2011
·
D. A. Ferrer
, S. Guchhait
, et al.
·
Journal of Applied Physics
·
14
Advanced si and sige strained channel NMOS and PMOS transistors with high-k/metal-gate stack
2004
·
S. Datta
, J. Brask
, et al.
·
IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
·
13
Graphene field-effect transistors using large-area monolayer graphene grown by chemical vapor deposition on Co thin films
2011
·
M. E. Ramon
, A. Gupta
, et al.
·
Conference digest
·
2
Analysis and Performance Comparison of CMOS and FinFET based DRAM Memory Cell
2016
·
Kidong Kim
, Ohseob Kwon
, et al.
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Works count:
29
Citation count:
3,143
H-index:
17
I10-index:
20
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