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V P Nikhil
Institution:
National Institute of Technology Tiruchirappalli
Observed institution:
National Institute of Technology Tiruchirappalli
ORCID:
0000-0003-3870-7485
Observed ORCID:
0000-0003-3870-7485
OpenAlex ID:
A5011499207
Flaw detection and monitoring over corroded surface through ultrasonic C-scan imaging
2019
·
V P Nikhil
, Biny R Wiston
, et al.
·
Engineering Research Express
·
6
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Works count:
1
Citation count:
6
H-index:
1
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