Author

Kaoru Otsuka

Observed name: K. Otsuka
Observed institution: NTT (Japan)
ORCID: 0000-0001-7326-1031
Observed ORCID: 0000-0001-7326-1031
OpenAlex ID: A5011561636
2004 · K. Otsuka, N. Mukawa · Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition · 2
2025 · Takuya Shimizu, Ryuichi Yoshizawa, et al. · ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA)
Works count: 2
Citation count: 2
H-index: 1
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