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Nitanshu Chauhan
Observed name:
Nitanshu Chauhan Chauhan
Institution:
Indian Institute of Technology Bhilai
Observed institutions:
Indian Institute of Technology Roorkee,
Indian Institute of Technology Bhilai,
National Institute of Technology Uttarakhand,
National Institute of Technology Srinagar
ORCID:
0000-0002-7993-3449
Observed ORCID:
0000-0002-7993-3449
OpenAlex ID:
A5011802530
Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on the Device Variation of Ferroelectric FET
2021
·
Chirag Garg
, Nitanshu Chauhan
, et al.
·
IEEE Electron Device Letters
·
66
Negative-to-Positive Differential Resistance Transition in Ferroelectric FET: Physical Insight and Utilization in Analog Circuits
2021
·
Nitanshu Chauhan
, Navjeet Bagga
, et al.
·
IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control
·
24
A Novel Twofold Tunnel FET With Reduced Miller Capacitance: Proposal and Investigation
2019
·
Navjeet Bagga
, Nitanshu Chauhan
, et al.
·
IEEE Transactions on Electron Devices
·
21
Performance Optimization of Analog Circuits in Negative Capacitance Transistor Technology
2021
·
Om Prakash
, Nitanshu Chauhan
, et al.
·
Microelectronics Journal
·
19
BOX engineering to mitigate negative differential resistance in MFIS negative capacitance FDSOI FET: an analog perspective
2021
·
Nitanshu Chauhan
, Navjeet Bagga
, et al.
·
Nanotechnology
·
17
Variability Effects in FinFET Transistors and Emerging NC-FinFET
2021
·
Aniket Gupta
, Nitanshu Chauhan
, et al.
·
IEEE International Conference on IC Design and Technology (ICICDT)
·
16
Investigation of Trap-Induced Performance Degradation and Restriction on Higher Ferroelectric Thickness in Negative Capacitance FDSOI FET
2021
·
Chirag Garg
, Nitanshu Chauhan
, et al.
·
IEEE Transactions on Electron Devices
·
16
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET
2021
·
Aniket Gupta
, Govind Bajpai
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
15
Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage
2022
·
Navjeet Bagga
, Kai Ni
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
14
Demonstration of a novel tunnel FET with channel sandwiched by drain
2019
·
Navjeet Bagga
, Nitanshu Chauhan
, et al.
·
Semiconductor Science and Technology
·
13
PDF
Physical Cause and Impact of Negative Capacitance Effect in Ferroelectric P(VDF-TrFE) Gate Stack and Its Application to Landau Transistor
2022
·
Khoirom Johnson Singh
, Nitanshu Chauhan
, et al.
·
IEEE Open Journal of Ultrasonics Ferroelectrics and Frequency Control
·
10
PDF
Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI
2022
·
Nitanshu Chauhan
, Chirag Garg
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
9
Performance Enhancement of FinFET Gas Sensor Using Negative Capacitance Effect
2025
·
Archana Pandey
, Nitanshu Chauhan
·
IEEE Sensors Journal
·
7
Time-Domain-Based Non-volatile In-Memory Computing Architecture Using FeFETs for Binary Neural Network
2024
·
Aditya Sharma
, Vatsal Dixit
, et al.
·
International Symposium on Quality Electronic Design (ISQED)
·
4
On the Resiliency of NC-FinFET SRAMs against Variation: MFIS Structure
2021
·
Aniket Gupta
, Nitanshu Chauhan
, et al.
·
International Conference on Simulation of Semiconductor Processes and Devices
·
4
A new physical insight into the zero-temperature coefficient with self-heating in silicon-on-insulator fin field-effect transistors
2021
·
Shashank Banchhor
, Nitanshu Chauhan
, et al.
·
Semiconductor Science and Technology
·
4
Demonstration of a Novel Ferroelectric-Dielectric Negative Capacitance Tunnel FET
2019
·
Navjeet Bagga
, Nitanshu Chauhan
, et al.
·
IEEE International Conference Modeling Systems Circuits and Devices
·
4
Gain Stabilization Methodology for FinFET Amplifiers Considering Self-Heating Effect
2021
·
Shashank Banchhor
, Nitanshu Chauhan
, et al.
·
International Conference on VLSI Design
·
3
Real Time Implementation of Convolutional Neural Network to Detect Plant Diseases Using Internet of Things
2019
·
Govind Bajpai
, Aniket Gupta
, et al.
·
Communications in computer and information science
·
3
Analysis and Modeling of Leakage Currents in Stacked Gate-All-Around Nanosheet Transistors
2022
·
S. Manikandan
, Nitanshu Chauhan
, et al.
·
IEEE International Conference on Emerging Electronics (ICEE)
·
2
Through-silicon-via induced stress-aware FinFET buffer sizing in 3D ICs
2022
·
Sarita Yadav
, Nitanshu Chauhan
, et al.
·
Semiconductor Science and Technology
·
2
A physical insight into variation aware minimum V DD for deep subthreshold operation of FinFET
2021
·
Sarita Yadav
, Nitanshu Chauhan
, et al.
·
Semiconductor Science and Technology
·
2
Benchmarking NC-CrossFET: Device-Level Insights and System Implications
2026
·
A. S. S. V. Sathvik
, Radha Bayya
, et al.
·
IEEE Transactions on Electron Devices
·
1
Breaking the Constant-Thickness Assumptions in Ferroelectric Negative Capacitance Transistors
2025
·
Radha Bayya
, Nitanshu Chauhan
, et al.
·
ACS Applied Electronic Materials
·
1
Self-Heating Induced Reliability Issues and Revealing Early Ageing in Thin PDSOI Transistor
2024
·
Amit Kumar
, Shashank Banchhor
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
1
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Works count:
42
Citation count:
281
H-index:
10
I10-index:
11
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