Author

Ville Vili Heikkinen

2013 · E Juntunen, E Tetri, et al. · Lighting Research & Technology · 54
2017 · Ville Heikkinen, Ville Byman, et al. · Metrologia · 27
2012 · K. Hanhijärvi, I. Kassamakov, et al. · Optics Letters · 24
2021 · Ralf D Geckeler, Matthias Schumann, et al. · Metrologia · 14
2024 · Aleksi Mattila, Johan Nysten, et al. · Measurement Science and Technology · 12
2012 · Ivan Kassamakov, Kestutis Grigoras, et al. · Journal of Microelectromechanical Systems · 10
2011 · V. Heikkinen, I. Kassamakov, et al. · IEEE Conference on Technologies for Homeland Security (HST) · 10
2004 · V. Heikkinen, J. Aikio, et al. · IEEE Photonics Technology Letters · 9
2013 · Jeremias Seppä, Ivan Kassamakov, et al. · Optical Engineering · 8
2013 · Kalle Hanhijarvi, Ivan Kassamakov, et al. · IEEE/ASME Transactions on Mechatronics · 8
2011 · V. Heikkinen, K. Hanhijärvi, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2020 · Ville Heikkinen, Johan Nysten, et al. · Surface Topography Metrology and Properties · 7
2009 · K. Keranen, J. Ollila, et al. · IEEE Transactions on Advanced Packaging · 7
2019 · Ville Heikkinen, Ville Byman, et al. · Advances in Metrology for X-Ray and EUV Optics · 5
2012 · T. Paulin, V. Heikkinen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2011 · V. Heikkinen, J. Aaltonen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2020 · V Heikkinen, I Kassamakov, et al. · Measurement Science and Technology · 4
2015 · E Juntunen, P Myöhänen, et al. · Lighting Research & Technology · 4
2013 · Jeremias Seppä, Ivan Kassamakov, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2012 · A. Nolvi, V. Heikkinen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2011 · V. Heikkinen, J. Aaltonen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2010 · V. Heikkinen, C. Barbeau, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Works count: 58
Citation count: 292
H-index: 9
I10-index: 8
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