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Satoshi Yokomizo
Institution:
Murata (Japan)
Observed institutions:
Tokyo Institute of Technology,
Murata (Japan)
ORCID:
0009-0003-3735-6043
Observed ORCID:
0009-0003-3735-6043
OpenAlex ID:
A5012025075
Data-driven analysis and visualization of dielectric properties curated from scientific literature
2025
·
Tomoki Murata
, Naoto Saito
, et al.
·
Science and Technology of Advanced Materials Methods
·
5
Evolution of Internal Stress and Influence on Dielectric Properties by Number of Dielectric Layers in MLCC
2010
·
Satoshi Yokomizo
, Takuya Hoshina
, et al.
·
Key engineering materials
·
4
Mechanism Underlying Stacking-Layer Effect of Dielectric Properties of Multilayer Ceramic Capacitors
2010
·
Satoshi Yokomizo
, Takuya Hoshina
, et al.
·
Japanese Journal of Applied Physics
·
2
PDF
Cold‐Sintered Multilayer Ceramic NTC Thermistors: Fabrication and Evaluation
2026
·
Satoshi Yokomizo
, Shuichi Funahashi
, et al.
·
Journal of the American Ceramic Society
·
1
Cold-sintered NiMn2O4 thermistors: An electrical aging and recovery study
2026
·
Julian Fanghanel
, Satoshi Yokomizo
, et al.
·
Journal of the European Ceramic Society
·
1
Stacking-Layer Effect on Dielectric Properties of Multilayer Ceramic Capacitors
2010
·
横溝 聡史
, Satoshi Yokomizo
, et al.
·
Institutional Repositories DataBase (IRDB)
Mlccの誘電体層数の増加による内部応力の発生と誘電特性への影響
2009
·
横溝 聡史
, Satoshi Yokomizo
, et al.
·
Institutional Repositories DataBase (IRDB)
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Works count:
8
Citation count:
13
H-index:
2
I10-index:
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