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Ralf Hammer
Observed names:
Hammer, R.,
Hammer, Ralf 1965-,
R Hammer,
R. Hammer
Institution:
Freiberger Compound Materials (Germany)
Observed institution:
Freiberger Compound Materials (Germany)
OpenAlex ID:
A5012262516
Growth and characterization of 200mm SI GaAs crystals grown by the VGF method
2003
·
J Stenzenberger
, T Bünger
, et al.
·
Journal of Crystal Growth
·
22
Non-destructive testing of damage layers in GaAs wafers by surface acoustic waves
1999
·
D Schneider
, R Hammer
, et al.
·
Semiconductor Science and Technology
·
21
PDF
Indentation-induced dislocations and cracks in (0001) freestanding and epitaxial GaN
2011
·
I Ratschinski
, H S Leipner
, et al.
·
Journal of Physics Conference Series
·
18
PDF
Nondestructive testing of damage layers in semiconductor materials by surface acoustic waves
2002
·
Dieter Schneider
, Eva Stiehl
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
12
Determination of the defect depth profile after saw cutting of GaAs wafers measured by positron annihilation
1998
·
F. Börner
, S. Eichler
, et al.
·
Journal of Applied Physics
·
11
Indentation response of single-crystalline GaAs in the nano-, micro-, and macroregime
2007
·
Frank Bergner
, Michael Schaper
, et al.
·
International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde)
·
10
Large-depth defect profiling in GaAs wafers after saw cutting
1999
·
F Börner
, S Eichler
, et al.
·
Applied Surface Science
·
10
Dislocations and cracks at Vickers indentations in (0 0 0 1) GaN single crystals
2010
·
I. Ratschinski
, H.S. Leipner
, et al.
·
Philosophical Magazine Letters
·
7
Point defects as result of surface deformation on a GaAs wafer
2003
·
C. Zamponi
, U. Männig
, et al.
·
Applied Physics Letters
·
7
Fracture Mechanical Evaluation of GaAs Wafers
2002
·
M. Schaper
, M. Jurisch
, et al.
·
MRS Proceedings
·
6
Mechanical Damage in GaAs Wafers Introduced by a Diamond Saw: A Study by Means of Positron Annihilation and Electron Microscopy
1996
·
R. Krause-Rehberg
, H. S. Leipner
, et al.
·
physica status solidi (a)
·
5
Dislocations and cracks at Vickers indentations in GaN and GaAs bulk crystals
2011
·
I. Ratschinski
, H. S. Leipner
, et al.
·
Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics
·
3
Material-related fundamentals of cutting techniques for GaAs wafer manufacturing
2005
·
Ralf Hammer
, Frank Bergner
, et al.
·
International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde)
·
3
Mikro- und Ultramikrohärteprüfung an GaAs-Einkristallen
2001
·
Frank Bergner
, Ute Bergmann
, et al.
·
Materials Testing
·
3
Non-destructive testing of damage layers in GaAs wafers by surface acoustic waves
1999
·
D Schneider
, R Hammer
, et al.
·
Semiconductor Science and Technology
·
1
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Works count:
22
Citation count:
139
H-index:
7
I10-index:
7
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