Author

T.W. MacElwee

Observed names: T. MacElwee, T. W. MacElwee, T.W MacElwee, Tom MacElwee, Tom Macelwee
OpenAlex ID: A5012387118
2002 · S.P. Voinigescu, S.W. Tarasewicz, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 73
2001 · James B. Webb, H. Tang, et al. · Journal of Crystal Growth · 27
2000 · J. A. Bardwell, I. Foulds, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 26
1995 · N.G. Tarr, D.J. Walkey, et al. · Solid-State Electronics · 22
2004 · H.G Liu, J.Q Wu, et al. · Journal of Crystal Growth · 20
2001 · Y. Liu, J.A. Bardwell, et al. · physica status solidi (a) · 17
2002 · S.S. Bazarjani, M. Snelgrove, et al. · International Symposium on Low Power Electronics and Design (ISLPED) · 16
1990 · T.W. MacElwee, I.D. Calder, et al. · IEEE Transactions on Electron Devices · 16
2021 · Gwen Rolland, Christophe Rodriguez, et al. · Energies · 11
2000 · H. Tang, J. B. Webb, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 10
2004 · D.J. Walkey, T.J. Smy, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 9
2002 · D.J. Walkey, T.J. Smy, et al. · Annual IEEE Semiconductor Thermal Measurement and Management Symposium/Proceedings · 9
1998 · N. G. Tarr, Y. Wang, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 9
2013 · Tom MacElwee, John Roberts, et al. · ECS Transactions · 5
2013 · J. Roberts, T. MacElwee, et al. · Additional Conferences (Device Packaging HiTEC HiTEN & CICMT) · 2
2011 · Harjinder Singh Saini, T. W. MacElwee, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2006 · P. Mascher, T.W. MacElwee, et al. · IEEE International Conference on Group IV Photonics (GFP) · 2
2002 · N.G. Tarr, R. Soreefan, et al. · IEEE International SOI Conference (SOI) · 2
2000 · T.W. MacElwee, J.A. Bardwell, et al. · Materials science forum · 2
1996 · N.G. Tarr, R. Soreefan, et al. · Electronics Letters · 2
Works count: 36
Citation count: 381
H-index: 11
I10-index: 13
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