Author

Patrick Bowen Montague

Observed names: Montague, Patrick, Montague, Patrick Bowen, P. B. Montague, Patrick B. Montague, Patrick Montague
ORCID: 0000-0002-9941-3651
Observed ORCID: 0000-0002-9941-3651
OpenAlex ID: A5012719537
2022 · Alejandro Martinez Jimenez, Sacha Grelet, et al. · IEEE Photonics Technology Letters · 15
2024 · Anamika Nair Karunakaran, Marco Clementi, et al. · Optics Express · 9
2025 · Sacha Grelet, Alejandro Martinez Jimenez, et al. · IEEE photonics journal · 6
2024 · C. R. Smith, D. H. Yeh, et al. · Journal of the Optical Society of America B · 4
2025 · Lucy Abbott, Gianni Nteroli, et al. · Biomedical Optics Express · 3
2023 · J. Connor Skehan, Anamika Nair Karunakaran, et al. · Optics Express · 3
2025 · Andrea Pertoldi, Abhilash Jha, et al. · Optics Express · 1
2024 · Andrea Pertoldi, Rasmus Dybbro Engelsholm, et al. · Journal of Lightwave Technology · 1
2024 · Andrea Pertoldi, Rasmus D. Engelsholm, et al. · Conference on Lasers and Electro-Optics · 1
2023 · Gianni Nteroli, Lucy Abbott, et al. · Optical Coherence Imaging Techniques and Imaging in Scattering Media · 1
2026 · Christensen, Erik, Smith, Callum, et al. · Zenodo (CERN European Organization for Nuclear Research)
2026 · Dung-Han Yeh, Victor Cardoso, et al. · Unconventional Optical Imaging
2026 · Angelo Manetta, Dung-Han Yeh, et al. · Unconventional Optical Imaging
2026 · Callum R. Smith, Erik N. Christensen, et al. · Fiber Lasers: Technology and Systems
2026 · Smith, Callum, Christensen, Erik, et al. · Zenodo (CERN European Organization for Nuclear Research)
2026 · Erik N. Christensen, Callum R. Smith, et al. · Conference on Lasers and Electro-Optics
2025 · André Sandmann, M. Ali Allousch, et al. · European Conference on Optical Communication
2024 · Pertoldi, Andrea, Engelsholm, Rasmus Dybbro, et al. · Research at the University of Copenhagen (University of Copenhagen)
2024 · Ali Mohebi, Abhijit Roy, et al. · Optical and Quantum Sensing and Precision Metrology II
2024 · Abhijit Roy, Ali Mohebi, et al. · Optical and Quantum Sensing and Precision Metrology II
Works count: 43
Citation count: 57
H-index: 4
I10-index: 2
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