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Author

Tongyao Han

Observed institution: Naval University of Engineering
ORCID: 0000-0002-2592-4328
Observed ORCID: 0000-0002-2592-4328
OpenAlex ID: A5013750267
A Reduced-Order Decoupling Method Applied to Efficient Junction Temperature Simulation Model in Multichip Devices
2023 · Tongyao Han, Yifei Luo, et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 17
Parameter Correction Method of Vce(on)-Based Junction Temperature Estimation Model Based on Bonding Wire Fatigue
2024 · Hao Yuan, Binli Liu, et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 3
Characterization on the thermal field inside IGBT cells during switching based on TCAD modeling and Thermoreflectance imaging
2023 · Xiao Ma, Yongle Huang, et al. · Microelectronics Journal · 3
Short-Duration Transient Temperature Distribution Prediction Model along Chip Vertical Path Applicable to Multi-Timescale Simulation
2022 · Tongyao Han, Yifei Luo, et al. · Energies · 3
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Thermal Balance-Based Evaluation Method for Safe Operating Areas and Its Degradation of IGBT Power Module
2025 · Tongyao Han, Yifei Luo, et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 2
A Digital Driver Proposed for Active Gate Control and Drain Currents Sharing between Parallel Chips in SiC-MOSFET Modules
2024 · Zenan Shi, Zicong Li, et al. · IEEE Transportation Electrification Conference and Expo · 2
Characterization of System-Level SOA With Dynamic Degradation Considering Electrothermal Stress Distribution in Power Units
2026 · Tongyao Han, Binli Liu, et al. · IEEE Transactions on Power Electronics
Dynamic Current-Sharing Model of Paralleled Chips with Common-Emitter Parasitic Parameter Distribution
2026 · Ming Zhang, Binli Liu, et al. · International Conference on Electrical Engineering and Green Energy (CEEGE)
IGBT Loss Regulation Method Based on Variable Gate Drive RC Configuration
2026 · Longquan Li, Binli Liu, et al. · Asia Energy and Electrical Engineering Symposium (AEEES)
Refined Modeling and Online Fault Diagnosis Method for Open-Circuit Faults in Dual-Active-Bridge Converters
2025 · Haolan Shen, Xin Tang, et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics
Works count: 10
Citation count: 30
H-index: 3
I10-index: 1
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