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J.C. Guo
Observed names:
Guo, J. C.,
J. C. Guo,
J.-C. Guo,
Jing Guo
Institutions:
Southwest Petroleum University,
Tencent (China),
State Key Laboratory of Oil and Gas Reservoir Geology and Exploitation,
Zhejiang University
Observed institutions:
Tianjin University of Technology,
Southwest Petroleum University,
Tencent (China),
Macronix International (Taiwan),
State Key Laboratory of Oil and Gas Reservoir Geology and Exploitation,
Vanguard International Semiconductor (Taiwan),
Zhejiang University
show all 7
ORCID:
0009-0001-2778-6985
Observed ORCID:
0009-0001-2778-6985
OpenAlex ID:
A5013810605
A three-terminal band-trap-band tunneling model for drain engineering and substrate bias effect on GIDL in MOSFET
1998
·
J.-C. Guo
, Y.-C. Liu
, et al.
·
IEEE Transactions on Electron Devices
·
24
Design Strategy Of Mlscr Devices For Sub-micron Cmos Technology
2005
·
T.C. Lu
, J.C. Guo
, et al.
·
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
·
10
Design of dual-band tunable bandpass filter with constant absolute bandwidth based on triple transmission path
2024
·
Jing Guo
, Lirong Qian
, et al.
·
International Journal of Microwave and Wireless Technologies
·
2
Characterization of bitline stress effects on flash cell after program/erase cycle
2002
·
V.C. Liu
, J.C. Guo
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
2
AdaRepair-Mem: Adaptive Experience Orchestration for Repository-Level Program Repair
2026
·
Luo, Z. C.
, Guo, J. C.
, et al.
·
arXiv (Cornell University)
PDF
Mechanisms of Hydraulic Fracture Propagation in Layered Shale Reservoirs
2026
·
C. Lu
, X. Y. Xu
, et al.
·
U.S. Rock Mechanics/Geomechanics Symposium (ARMA)
Research on the Evolution Law of Seepage-Stress Field under Fracturing-Flooding Conditions
2026
·
C. Lu
, H. Ma
, et al.
·
U.S. Rock Mechanics/Geomechanics Symposium (ARMA)
Study on the mechanical mechanisms of shut-in imbibition in fractured tight reservoirs
2026
·
L. Ma
, J.F. Wu
, et al.
·
U.S. Rock Mechanics/Geomechanics Symposium (ARMA)
New characterization methodology for flash memory cell using CAST structure
2002
·
M. Fan
, U.C. Liu
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
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Works count:
9
Citation count:
38
H-index:
2
I10-index:
2
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