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Leonhard Sturm-Rogon
Observed names:
L. Sturm-Rogon,
Sturm-Rogon, Leonhard
Institution:
Fraunhofer Research Institution for Microsystems and Solid State Technologies
Observed institutions:
Fraunhofer Research Institution for Microsystems and Solid State Technologies,
Fraunhofer-Gesellschaft
ORCID:
0000-0002-0021-3888
Observed ORCID:
0000-0002-0021-3888
OpenAlex ID:
A5014307506
Low-Noise Si-JFETs Enhanced by Split-Channel Concept
2020
·
Leonhard Sturm-Rogon
, Karl Neumeier
, et al.
·
IEEE Transactions on Electron Devices
·
7
CMOS-compatible processing and room-temperature characterization at the wafer level for scalable quantum computing
2025
·
S.J.K. Lang
, T. Mayer
, et al.
·
Physical Review Applied
·
5
PDF
Wafer-Scale Electrical Characterization of Al/AlxOy/Al Tunnel Junctions for Process Monitoring at Room Temperature
2026
·
Simon Johann Klaus Lang
, Ignaz Eisele
, et al.
·
Nanomaterials
·
3
PDF
Comparison of annealing quality after 3e15/cm2 50 keV BF2+ implant between rapid thermal annealing and furnace annealing
2022
·
Leonhard Sturm-Rogon
, Alexander Burenkov
, et al.
·
MRS Advances
·
2
PDF
Wafer-Scale Electrical Characterization of Al/AlxOy/Al Tunnel Junctions for Process Monitoring at Room Temperature
2026
·
Lang, Simon
, Eisele, Ignaz
, et al.
·
Fraunhofer-Publica (Fraunhofer-Gesellschaft)
Low Voltage-Controlled Noise Tuning Diodes Oscillators for
2022
·
Rohde, Ulrich L.
, Eisele, Ignatz
, et al.
·
Fraunhofer-Publica (Fraunhofer-Gesellschaft)
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Works count:
8
Citation count:
18
H-index:
3
I10-index:
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