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Ruud Schampers

Observed names: R Schampers, R. Schampers, Schampers R
ORCID: 0009-0003-8575-8856
Observed ORCID: 0009-0003-8575-8856
OpenAlex ID: A5014345896
Preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography
2020 · Felix R. Wagner, Reika Watanabe, et al. · Nature Protocols · 201
A focused ion beam milling and lift-out approach for site-specific preparation of frozen-hydrated lamellas from multicellular organisms
2015 · Julia Mahamid, Ruud Schampers, et al. · Journal of Structural Biology · 169
A MEMS ‐based heating holder for the direct imaging of simultaneous in‐situ heating and biasing experiments in scanning/transmission electron microscopes
2016 · Luigi Mele, Stan Konings, et al. · Microscopy Research and Technique · 113
Strain relaxation in transistor channels with embedded epitaxial silicon germanium source/drain
2008 · J. P. Liu, K. Li, et al. · Applied Physics Letters · 34
Tomo Live : an on-the-fly reconstruction pipeline to judge data quality for cryo-electron tomography workflows
2024 · Maxime Comet, Patricia M. Dijkman, et al. · Acta Crystallographica Section D Structural Biology · 21
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High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source
2010 · S Kellogg, R Schampers, et al. · Microscopy and Microanalysis · 16
A Comparison of Xenon Plasma FIB Technology with Conventional Gallium LMIS FIB: Imaging, Milling, and Gas-Assisted Applications
2011 · R Young, C Rue, et al. · Microscopy and Microanalysis · 12
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In-line TEM sample preparation and wafer return strategy for rapid yield learning
2006 · N. Bicaïs-Lépinay, F. André, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
In-Situ Sample Preparation and High-Resolution SEM-STEM Analysis
2004 · Richard J. Young, Michael P. Bernas, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 5
Applications of In-situ Sample Preparation and Modeling of SEM-STEM Imaging
2008 · R.J. Young, A. Buxbaum, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 4
Backside TEM Sample Preparation With The Multi-Loader Flip-Stage
2009 · A Buxbaum, R Schampers, et al. · Microscopy and Microanalysis · 3
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High volume TEM-sample preparation using a wafer saving in-line preparation tool
2009 · U. Muehle, S. Jansen, et al. · Springer eBooks · 1
In-Situ Sample Preparation and Modeling of SEM-STEM Imaging
2008 · RJ Young, A Buxbaum, et al. · Microscopy and Microanalysis · 1
Cryo-electron tomography of keyhole limpet hemocyanin
2024 · Comet M, Dijkman PM, et al. · EMPIAR dataset
In situ cryo-electron tomography of Saccharomyces cerevisiae
2024 · Comet M, Dijkman PM, et al. · EMPIAR dataset
Site-Specific Analysis of Advanced Packaging Enabled by Focused Ion Beams (FIB)
2010 · Richard J. Young, Chad Rue, et al. · Wafer-Level Packaging Symposium
Works count: 16
Citation count: 587
H-index: 7
I10-index: 7
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