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Author

Erfanul Haque

ORCID: 0000-0002-8259-0790
Observed ORCID: 0000-0002-8259-0790
OpenAlex ID: A5014739494
High Accuracy Swin Transformers for Imagebased Wafer Map Defect Detection
2022 · Thahmidul Islam Nafi, Erfanul Haque, et al. · International Journal of Engineering and Manufacturing · 12
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Industrial Product Defect Detection Using Custom U-Net
2022 · Al Amin, Hongjie Ma, et al. · International Conference on Computer and Information Technology (ICCIT) · 8
Analysing and Detecting Extreme-Selfie Images Using Ensemble Technique
2022 · Al Amin, Hongjie Ma, et al. · International Conference on Computer and Information Technology (ICCIT) · 4
ADPT: An Automated Disease Prognosis Tool Towards Classifying Medical Disease Using Hybrid Architecture of Deep Learning Paradigm
2022 · Sabila Al Jannat, Al Amin, et al. · International Conference on Computer and Information Technology (ICCIT) · 2
Hybrid Machine Learning model for A Next-Generation Ecofriendly Travelling and Guides to Reduce Carbon Emissions
2022 · Elias Hossain, Wahidur Rahman, et al. · International Conference on Computer and Information Technology (ICCIT) · 1
Works count: 7
Citation count: 27
H-index: 3
I10-index: 1
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