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Kaoru Kajiwara
Observed name:
梶原, 薫
Institution:
Sumco Corporation (Japan)
Observed institutions:
Kyushu University,
Sumco Corporation (Japan)
ORCID:
0000-0001-6510-9232
Observed ORCID:
0000-0001-6510-9232
OpenAlex ID:
A5014928291
Oxygen concentration dependence of as-grown defect formation in nitrogen-doped Czochralski silicon single crystals
2021
·
Kaoru Kajiwara
, Kazuhisa Torigoe
, et al.
·
Journal of Crystal Growth
·
15
Oxygen Precipitation Properties of Nitrogen‐Doped Czochralski Silicon Single Crystals with Low Oxygen Concentration
2019
·
Kaoru Kajiwara
, Kazuhiro Harada
, et al.
·
physica status solidi (a)
·
13
Nitrogen-Doped Czochralski Silicon Wafers as Materials for Conventional and Scaled Insulated Gate Bipolar Transistors
2022
·
Kaoru Kajiwara
, Kazutaka Eriguchi
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
5
PDF
Evaluation of thermally activated defects behaviors in nitrogen-doped Czochralski silicon single crystals using deep level transient spectroscopy
2023
·
Kaoru Kajiwara
, Kazutaka Eriguchi
, et al.
·
Japanese Journal of Applied Physics
·
4
PDF
First Principles Analysis on Void-Reduction Mechanism and Impact of Oxygen in Nitrogen-Doped Cz-Si Crystal
2023
·
Akira Sada
, Yusuke Noda
, et al.
·
Journal of Crystal Growth
·
3
PDF
Oxygen Precipitation Properties of Nitrogen-Doped Czochralski Silicon Single Crystals with Low Oxygen Concentration
2018
·
Kaoru Kajiwara
, Kazuhiro Harada
, et al.
·
The Japan Society of Applied Physics
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Works count:
7
Citation count:
40
H-index:
4
I10-index:
2
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