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Author

Adam Cron

Observed names: A. Cron, A.D. Cron, Cron, Adam
ORCID: 0000-0003-2811-0992
Observed ORCID: 0000-0003-2811-0992
OpenAlex ID: A5015104614
POCA: First Power-on Chip Authentication in Untrusted Foundry and Assembly
2021 · Md Sami Ul Islam Sami, Fahim Rahman, et al. · IEEE International Symposium on Hardware Oriented Security and Trust (HOST) · 20
Invited: End-to-End Secure SoC Lifecycle Management
2021 · Md Sami Ul Islam Sami, Fahim Rahman, et al. · ACM/IEEE Design Automation Conference (DAC) · 17
IEEE P1149.4-almost a standard
2002 · A. Cron · IEEE International Test Conference (ITC) · 15
IEEE Standard 1838 Is on the Move
2021 · Adam Cron, Erik Jan Marinissen · Computer · 11
Quantifiable Assurance: From IPs to Platforms
2022 · Ahmed, Bulbul, Bepary, Md Kawser, et al. · arXiv (Cornell University) · 10
PDF
IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers
2018 · Yu Li, Ming Shao, et al. · IEEE European Test Symposium (ETS) · 8
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test
2006 · Bambang Suparjo, Adam Ley, et al. · IEEE International Test Conference (ITC) · 8
CAPEC: A Cellular Automata Guided FSM-based IP Authentication Scheme
2023 · Mridha Md Mashahedur Rahman, M Sazadur Rahman, et al. · IEEE VLSI Test Symposium (VTS) · 7
P1149.4 Mixed-Signal Test Bus
1996 · A. Cron · IEEE Design & Test of Computers · 6
Test Methodology Automation for Multi-Die Package Realization
2022 · Rohini Gulve, Durga Prasad Bade, et al. · IEEE International Test Conference India (ITC India) · 4
Applying IEEE Test Standards to Multidie Designs
2022 · Teresa McLaurin, Adam Cron · IEEE Design and Test · 4
IEEE-1149.1 use in design for verification and testability at Texas Instruments
2003 · A.D. Cron · Annual IEEE International ASIC Conference and Exhibit · 2
Guest Editors’ Introduction: Special Issue on Design and Test of Multidie Packages
2022 · Adam Cron, Hailong Jiao, et al. · IEEE Design and Test · 1
PDF
IEEE Std P1838: 3D Test Access Standard Under Development
2019 · Adam Cron, Erik Jan Marinissen, et al. · Wiley eBooks · 1
Status of IEEE testability standards 1149.4, 1532 and 1149.6
2004 · S.K. Sunter, Adam Osseiran, et al. · Design, Automation, and Test in Europe · 1
Innovative Practices Session: Recent Developments in IEEE Draft Standards P1687, P1687.2, and P2929
2026 · Adam Cron, Stephen Sunter, et al. · IEEE VLSI Test Symposium (VTS)
Innovative Practices Session: Recent Developments in IEEE Draft Standards P1838a & P3164, and Analog Soft Defects
2026 · Adam Cron, Sohrab Aftabjahani, et al. · IEEE VLSI Test Symposium (VTS)
TUT10 - What Can In-System Test and SLM Data Bring to the Reliability Community?
2026 · IEEE International Symposium on Reliability Physics 2026, Cron, Adam · Underline Science Inc.
Delay Testing
2006 · Adam Cron · Frontiers in electronic testing
Designing IEEE Std 1149.1 into your semiconductor products
2002 · A.D. Cron · Annual IEEE International ASIC Conference and Exhibit
Works count: 26
Citation count: 115
H-index: 7
I10-index: 5
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