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A. A. Studna
Observed names:
A. A. STUDNA,
A.A. Studna
Institution:
New Jersey Health Foundation
Observed institutions:
AT&T (United States),
University of Illinois Urbana-Champaign,
Core Competence,
New Jersey Health Foundation
OpenAlex ID:
A5015224960
Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV
1983
·
D. E. Aspnes
, A. A. Studna
·
Physical review. B, Condensed matter
·
4,047
High Precision Scanning Ellipsometer
1975
·
D. E. Aspnes
, A. A. Studna
·
Applied Optics
·
650
Schottky-Barrier Electroreflectance: Application to GaAs
1973
·
D. E. Aspnes
, A. A. Studna
·
Physical review. B, Solid state
·
593
Application of reflectance difference spectroscopy to molecular-beam epitaxy growth of GaAs and AlAs
1988
·
D. E. Aspnes
, J. P. Harbison
, et al.
·
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
·
508
Anisotropies in the Above—Band-Gap Optical Spectra of Cubic Semiconductors
1985
·
D. E. Aspnes
, A. A. Studna
·
Physical Review Letters
·
426
Dielectric properties of heavily doped crystalline and amorphous silicon from 1.5 to 6.0 eV
1984
·
D. E. Aspnes
, A. A. Studna
, et al.
·
Physical review. B, Condensed matter
·
330
Chemical etching and cleaning procedures for Si, Ge, and some III-V compound semiconductors
1981
·
D. E. Aspnes
, A. A. Studna
·
Applied Physics Letters
·
228
Optical reflectance and electron diffraction studies of molecular-beam-epitaxy growth transients on GaAs(001)
1987
·
D. E. Aspnes
, J. P. Harbison
, et al.
·
Physical Review Letters
·
211
Kinetic Limits of Monolayer Growth on (001) Gaas by Organometallic Chemical-vapor Deposition
1988
·
D. E. Aspnes
, E. Colas
, et al.
·
Physical Review Letters
·
133
Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimeters
1978
·
D. E. Aspnes
, A. A. Studna
·
Review of Scientific Instruments
·
123
Optical Properties of GaAs and Its Electrochemically Grown Anodic Oxide from 1.5 to 6.0 eV
1981
·
D. E. Aspnes
, G. P. Schwartz
, et al.
·
Journal of The Electrochemical Society
·
113
PDF
Direct optical measurement of surface dielectric responses: Interrupted growth on (001) GaAs
1990
·
D. E. Aspnes
, Y. C. Chang
, et al.
·
Physical Review Letters
·
107
Reflectance-difference spectroscopy system for real-time measurements of crystal growth
1988
·
D. E. Aspnes
, J. P. Harbison
, et al.
·
Applied Physics Letters
·
106
Oscillations in the optical response of (001)GaAs and AlGaAs surfaces during crystal growth by molecular beam epitaxy
1988
·
J. P. Harbison
, D. E. Aspnes
, et al.
·
Applied Physics Letters
·
100
Optical properties of anodically grown native oxides on some Ga-V compounds from 1.5 to 6.0 eV
1977
·
D. E. Aspnes
, B. Schwartz
, et al.
·
Journal of Applied Physics
·
81
Low-retardance fused-quartz window for real-time optical applications in ultrahigh vacuum
1989
·
A. A. Studna
, D. E. Aspnes
, et al.
·
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
·
74
Direct observation of the E0 and E0 + Δ0 transitions in silicon
1972
·
D.E. Aspnes
, A.A. Studna
·
Solid State Communications
·
74
Reflectance–difference studies of organometallic chemical vapor deposition growth transients on (001) GaAs
1989
·
D. E. Aspnes
, R. Bhat
, et al.
·
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
·
65
An investigation of ion-bombarded and annealed 〈111〉 surfaces of Ge by spectroscopic ellipsometry
1980
·
D.E. Aspnes
, A.A. Studna
·
Surface Science
·
58
Optical studies of molecular-beam epitaxy growth of GaAs and AlAs
1988
·
D. E. Aspnes
, J. P. Harbison
, et al.
·
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
·
56
Reflectance–difference spectroscopy of (110) GaAs and InP
1987
·
D. E. Aspnes
, A. A. Studna
·
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
·
45
In situ monitoring of crystal growth by reflectance difference spectroscopy
1991
·
E. Colas
, D.E. Aspnes
, et al.
·
Journal of Crystal Growth
·
41
Stability of (100)GaAs surfaces in aqueous solutions
1985
·
D. E. Aspnes
, A. A. Studna
·
Applied Physics Letters
·
33
Geometrically Exact Ellipsometer Alignment
1971
·
D. E. Aspnes
, A. A. Studna
·
Applied Optics
·
29
Reflectance-difference studies of organometallic chemical-vapor-deposition growth transients on (001) GaAs
1989
·
E. Colas
, D.E. Aspnes
, et al.
·
Journal of Crystal Growth
·
28
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Works count:
52
Citation count:
8,490
H-index:
25
I10-index:
37
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