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Julien Körfer
Observed names:
Julien Koerfer,
Körfer, Julien
Institution:
Fraunhofer Institute for Integrated Systems and Device Technology
Observed institutions:
Friedrich-Alexander-Universität Erlangen-Nürnberg,
Fraunhofer Institute for Integrated Systems and Device Technology
ORCID:
0009-0006-7501-4468
Observed ORCID:
0009-0006-7501-4468
OpenAlex ID:
A5015250620
Effect of Ligand Treatment on the Tuning of Infrared Plasmonic Indium Tin Oxide Nanocrystal Electrochromic Devices
2020
·
Oleksandr Mashkov
, Julien Körfer
, et al.
·
Advanced Engineering Materials
·
21
PDF
Plasma Treatment after NiSi-Based Ohmic Contact Formation on 4H-SiC to Enhance Adhesion of Subsequent Backside Metallization
2024
·
Tom Becker
, Carsten Hellinger
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
1
PDF
Improvement of Reflectance Spectroscopy for Oxide Layers on 4H-SiC
2024
·
Julien Koerfer
, Mathias Rommel
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
1
PDF
Optical Critical Dimension Metrology for the SiC Trench MOSFET Process
2026
·
Boglárka Dikó
, Oleg Rusch
, et al.
·
Key engineering materials
Challenges in Measuring Thin SiO2 Layers on 4H-SiC via Spectroscopic Ellipsometry
2026
·
László Makai
, Julien Körfer
, et al.
·
Materials science forum
Optical Critical Dimension Metrology for the SiC Trench MOSFET Process
2026
·
Dikó, Boglárka
, Rusch, Oleg
, et al.
·
Fraunhofer-Publica (Fraunhofer-Gesellschaft)
Challenges in Measuring Thin SiO2 Layers on 4H-SiC via Spectroscopic Ellipsometry
2026
·
Makai, László
, Körfer, Julien
, et al.
·
Fraunhofer-Publica (Fraunhofer-Gesellschaft)
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Works count:
7
Citation count:
23
H-index:
1
I10-index:
1
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