Author

S. Park

2020 · H.-C. Park, D. Kang, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 137
2006 · S. Park, Y. Tsunemitsu, et al. · IEEE Transactions on Antennas and Propagation · 124
2010 · S. Park, C. Jung · Electronics Letters · 44
2023 · Daewon Ha, Wonsok Lee, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 35
2011 · H.-J. Cho, K.-I. Seo, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 28
2006 · S. Park, J. Song, et al. · IEEE Transactions on Vehicular Technology · 22
2020 · H.-C. Park, D. Kang, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 16
2025 · D. Ha, Y. Lee, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 14
2004 · Y. Joo, G. Lee, et al. · IEEE Photonics Technology Letters · 13
1997 · Y. Jhung, S. Park · IEEE Transactions on Consumer Electronics · 13
2002 · S. Park, Ho Shin Cho, et al. · IEEE Vehicular Technology Conference · 12
2023 · Sewon Park, Kyeongwon Lee, et al. · IEEE Transactions on Semiconductor Manufacturing · 10
2023 · Haksoo Lim, Sewon Park, et al. · ACM International Conference on Information and Knowledge Management (CIKM) · 9
2020 · Y. Kwon, M. Kim, et al. · Symposium on VLSI Circuits · 6
2014 · W.-G. Yeo, O. Gurel, et al. · International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) · 6
2013 · W.-G. Yeo, N.K. Nahar, et al. · International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) · 6
2000 · Hongsik Jeong, Wonyoung Yang, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 5
2020 · S.W. Hwang, Seungju Han, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 4
2010 · S. Park, J. Lee, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 4
2002 · K.N. Kim, H.S. Jeong, et al. · Symposium on VLSI Technology · 4
2021 · U. Celano, Y. Lee, et al. · Solid-State Electronics · 2
2006 · S. Park · Journal of Allergy and Clinical Immunology · 2
2016 · Franz Brauße, Pieter Collins, et al. · arXiv (Cornell University) · 1
2015 · S. Pae, H.C. Sagong, et al. · IEEE International Integrated Reliability Workshop final report · 1
Works count: 34
Citation count: 528
H-index: 11
I10-index: 13
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