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Eugen Foca

Deep Silicon Macropores Filled with Copper by Electrodeposition
2006 · Cheng Fang, Eugen Foca, et al. · Journal of The Electrochemical Society · 66
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Pore Etching in III-V and II-VI Semiconductor Compounds in Neutral Electrolyte
2007 · I. M. Tiginyanu, V. V. Ursaki, et al. · Electrochemical and Solid-State Letters · 39
Modelling electrochemical current and potential oscillations at the Si electrode
2007 · E. Foca, J. Carstensen, et al. · Journal of Electroanalytical Chemistry · 37
Formation of metal wire arrays via electrodeposition in pores of Si, Ge and III–V semiconductors
2007 · C. Fang, E. Foca, et al. · physica status solidi (a) · 18
Strongly frequency dependent focusing efficiency of a concave lens based on two-dimensional photonic crystals
2005 · E. Foca, H. Föll, et al. · Applied Physics Letters · 18
Temperature dependence of Raman scattering in porous gallium phosphide
2001 · V V Ursaki, I M Tiginyanu, et al. · Journal of Physics Condensed Matter · 16
New modes of FFT impedance spectroscopy applied to semiconductor pore etching and materials characterization
2008 · J. Carstensen, E. Foca, et al. · physica status solidi (a) · 14
Focusing effect of photonic crystal concave lenses made from porous dielectrics
2004 · V. V. Sergentu, E. Foca, et al. · physica status solidi (a) · 13
ACLV degradation: root cause analysis and effective monitoring strategy
2008 · Anna Tchikoulaeva, Andre Holfeld, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12
New type of haze formation on masks fabricated with Mo-Si blanks
2010 · E. Foca, A. Tchikoulaeva, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10
3D analysis of high-aspect ratio features in 3D-NAND
2020 · Jens-Timo Neumann, Dmitry Klochkov, et al. · Metrology, Inspection, and Process Control XXXVI · 9
Focusing slabs made of negative index materials based on inhomogeneous dielectric rods
2006 · V. V. Sergentu, V. V. Ursaki, et al. · physica status solidi (a) · 8
Efficient focusing with a concave lens based on a photonic crystal with an unusual effective index of refraction
2005 · E. Foca, H. Föll, et al. · physica status solidi (a) · 7
Superlensing with plane plates consisting of dielectric cylinders in glass envelopes
2008 · E. Foca, V. V. Sergentu, et al. · physica status solidi (a) · 5
Monte Carlo simulation of electrochemical oscillations in the electropolishing regime
2005 · E. Foca, J. Carstensen, et al. · physica status solidi (a) · 5
Haze risk reduced mask manufacturing process
2010 · Pavel Nesladek, Valentine Baudiquez, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Design and Characterization of Novel Focusing Elements Based on Photonic Metamaterials
2009 · I. M. Tiginyanu, E. Foca, et al. · Journal of Nanoelectronics and Optoelectronics · 4
Smoothening the Pores Walls in Macroporous n-Si
2007 · Eugen Foca, Juergen Carstensen, et al. · ECS Transactions · 4
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Understanding and Controlling Pore Etching in Semiconductors
2007 · Helmut Foell, Juergen Carstensen, et al. · ECS Transactions · 4
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Controlling Macropores Etching in n-Si by Means of in-situ FFT Voltage- and Photoimpedance Spectroscopy
2007 · Eugen Foca, Juergen Carstensen, et al. · ECS Transactions · 4
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Pores growth control by in‐situ FFT impedance spectroscopy
2007 · E. Foca, J. Carstensen, et al. · physica status solidi (a) · 4
Photonic crystals as host material for a new generation of microwave components
2006 · F. Daschner, R. Knöchel, et al. · Advances in radio science · 4
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Self-induced oscillations in Si and other semiconductors
2006 · Helmut Föll, Jürgen Carstensen, et al. · International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) · 4
Properties of 2D and 3D Dielectric Structures Fabricated by Electrochemical Dissolution of III-V Compounds
2001 · I.M. Tiginyanu, S. Langa, et al. · MRS Proceedings · 4
Defect detection and classification on imec iN5 node BEoL test vehicle with MultiSEM
2022 · Jens Timo Neumann, Abhilash Srikantha, et al. · Metrology, Inspection, and Process Control XXXVI · 3
Works count: 52
Citation count: 332
H-index: 10
I10-index: 10
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